Evolution of the wave steepening factor for high-amplitude sound propagation

2013 ◽  
Vol 134 (5) ◽  
pp. 3981-3981
Author(s):  
Michael B. Muhlestein ◽  
Kent L. Gee ◽  
Tracianne B. Nielsen ◽  
Derek C. Thomas
2021 ◽  
Vol 118 (10) ◽  
pp. 104102
Author(s):  
Jiangyi Zhang ◽  
Vicente Romero-García ◽  
Georgios Theocharis ◽  
Olivier Richoux ◽  
Vassos Achilleos ◽  
...  

1988 ◽  
Vol 110 (4) ◽  
pp. 545-551 ◽  
Author(s):  
A. Cummings ◽  
I.-J. Chang

A quasi one-dimensional analysis of sound transmission in a flow duct lined with an array of nonlinear resonators is described. The solution to the equations describing the sound field and the hydrodynamic flow in the neighborhood of the resonator orifices is performed numerically in the time domain, with the object of properly accounting for the nonlinear interaction between the acoustic field and the resonators. Experimental data are compared to numerical computations in the time domain and generally very good agreement is noted. The method described here may readily be extended for use in the design of exhaust mufflers for internal combustion engines.


2014 ◽  
Vol 135 (4) ◽  
pp. 2381-2382
Author(s):  
Brent O. Reichman ◽  
Michael B. Muhlestein ◽  
Kent L. Gee ◽  
Tracianne B. Neilsen ◽  
Derek C. Thomas

2017 ◽  
Vol 13 (1) ◽  
pp. 4522-4534
Author(s):  
Armando Tomás Canero

This paper presents sound propagation based on a transverse wave model which does not collide with the interpretation of physical events based on the longitudinal wave model, but responds to the correspondence principle and allows interpreting a significant number of scientific experiments that do not follow the longitudinal wave model. Among the problems that are solved are: the interpretation of the location of nodes and antinodes in a Kundt tube of classical mechanics, the traslation of phonons in the vacuum interparticle of quantum mechanics and gravitational waves in relativistic mechanics.


AIAA Journal ◽  
2000 ◽  
Vol 38 ◽  
pp. 768-773 ◽  
Author(s):  
Yusuf Ozyoruk ◽  
Lyle N. Long

1989 ◽  
Author(s):  
EDMOND LO ◽  
R. FERGUSON ◽  
MICHAEL FRISH ◽  
PETERE. NEBOLSINE
Keyword(s):  

Author(s):  
J. N. C. de Luna ◽  
M. O. del Fierro ◽  
J. L. Muñoz

Abstract An advanced flash bootblock device was exceeding current leakage specifications on certain pins. Physical analysis showed pinholes on the gate oxide of the n-channel transistor at the input buffer circuit of the affected pins. The fallout contributed ~1% to factory yield loss and was suspected to be caused by electrostatic discharge or ESD somewhere in the assembly and test process. Root cause investigation narrowed down the source to a charged core picker inside the automated test equipment handlers. By using an electromagnetic interference (EMI) locator, we were able to observe in real-time the high amplitude electromagnetic pulse created by this ESD event. Installing air ionizers inside the testers solved the problem.


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