Seabed roughness parameters for the Malta Plateau from joint backscatter and reflection inversion

2013 ◽  
Vol 133 (5) ◽  
pp. 3252-3252
Author(s):  
Gavin Steininger ◽  
Charles W. Holland ◽  
Stan E. Dosso ◽  
Jan Dettmer
2013 ◽  
Vol 134 (3) ◽  
pp. 1833-1842 ◽  
Author(s):  
Gavin Steininger ◽  
Charles W. Holland ◽  
Stan E. Dosso ◽  
Jan Dettmer

2013 ◽  
Author(s):  
Gavin Steininger ◽  
Charles W. Holland ◽  
Stan E. Dosso ◽  
Jan Dettmer

Molecules ◽  
2021 ◽  
Vol 26 (4) ◽  
pp. 900
Author(s):  
Maria Vardaki ◽  
Aida Pantazi ◽  
Ioana Demetrescu ◽  
Marius Enachescu

In this work we present the results of a functional properties assessment via Atomic Force Microscopy (AFM)-based surface morphology, surface roughness, nano-scratch tests and adhesion force maps of TiZr-based nanotubular structures. The nanostructures have been electrochemically prepared in a glycerin + 15 vol.% H2O + 0.2 M NH4F electrolyte. The AFM topography images confirmed the successful preparation of the nanotubular coatings. The Root Mean Square (RMS) and average (Ra) roughness parameters increased after anodizing, while the mean adhesion force value decreased. The prepared nanocoatings exhibited a smaller mean scratch hardness value compared to the un-coated TiZr. However, the mean hardness (H) values of the coatings highlight their potential in having reliable mechanical resistances, which along with the significant increase of the surface roughness parameters, which could help in improving the osseointegration, and also with the important decrease of the mean adhesion force, which could lead to a reduction in bacterial adhesion, are providing the nanostructures with a great potential to be used as a better alternative for Ti implants in dentistry.


Photonics ◽  
2020 ◽  
Vol 7 (4) ◽  
pp. 104
Author(s):  
Anastasia Yakuhina ◽  
Alexey Kadochkin ◽  
Vyacheslav Svetukhin ◽  
Dmitry Gorelov ◽  
Sergey Generalov ◽  
...  

This article presents the results of the study of the influence of the most significant parameters of the side wall roughness of an ultra-thin silicon nitride lightguide layer of multimode integrated optical waveguides with widths of 3 and 8 microns. The choice of the waveguide width was made due to the need to provide multimode operation for telecommunication wavelengths, which is necessary to ensure high integration density. Scattering in waveguide structures was measured by optical frequency domain reflectometry (OFDR) of a backscattering reflectometer. The finite difference time domain method (FDTD) was used to study the effect of roughness parameters on optical losses in fabricated waveguides, the roughness parameters that most strongly affect optical scattering were determined, and methods of its significant reduction were specified. The prospects for implementing such structures on a quartz substrate are justified.


2011 ◽  
Vol 189-193 ◽  
pp. 1538-1542
Author(s):  
Li Xiao Jia ◽  
Yong Zhen Zhang ◽  
Yong Ping Niu ◽  
San Ming Du ◽  
Jian Li

In order to decrease accidents of slips and falls, COFs of rubber samples with different surface roughness were measured by Brungraber Mark II. And the correlation coefficients between roughness parameters and COF were calculated. The rusults have shown that the COF increases with surface roughness and the correlation coefficient between Sq and COF is highest. In general, almost all the roughness parameters used in the study have high correlation with COF. Parameters had the highest correlation with COF depends on the materials used and test conditions.


2016 ◽  
Vol 75 (3) ◽  
pp. 335-346 ◽  
Author(s):  
Lidia Gurau ◽  
Nadir Ayrilmis ◽  
Jan Thore Benthien ◽  
Martin Ohlmeyer ◽  
Manja Kitek Kuzman ◽  
...  

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