Effect of Baffle Width on Beam Patterns of Planar Arrays

Richard E. Douglass; George J. Gruber

doi:10.1121/1.2143703

PENCIL BEAM PATTERNS OBTAINED BY PLANAR ARRAYS OF PARASITIC DIPOLES FED BY ONLY ONE ACTIVE ELEMENT

Progress In Electromagnetics Research ◽

10.2528/pier10040705 ◽

2010 ◽

Vol 103 ◽

pp. 419-431 ◽

Cited By ~ 8

Author(s):

M. Alvarez Folgueiras ◽

J. A. Rodriguez Gonzalez ◽

Francisco Jose Ares-Pena

Keyword(s):

Active Element ◽

Pencil Beam ◽

Planar Arrays ◽

Beam Patterns

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Multiple Solutions Starting from Real Shaped Beams in Equispaced Linear Arrays

Sensors ◽

10.3390/s21010062 ◽

2020 ◽

Vol 21 (1) ◽

pp. 62

Author(s):

Aarón Ángel Salas-Sánchez ◽

Camilo López-Castro ◽

Paolo Rocca ◽

Juan Antonio Rodríguez-González ◽

María Elena López-Martín ◽

...

Keyword(s):

Multiple Solutions ◽

Space Vehicle ◽

Linear Arrays ◽

Resonant Structures ◽

Planar Arrays ◽

Half Wavelength ◽

Standard Linear ◽

Beam Patterns ◽

Flat Top Beam

In the present work, the theoretical basis of the multiplicity of solutions obtained from an initial real symmetric distribution is derived. This initial solution is devoted to generating an equivalent pure real shaped-beam pattern for a concrete synthesis scenario. However, these new solutions are not based on real symmetric distributions; hence, not based on the generation of pure real patterns. The bandwidth performances and tolerance to errors provided by the multiple solutions in the array design are analyzed by considering different architectures, also including mutual coupling models and element factor expressions due to accuracy purposes. In addition, a technique to obtain efficient linear arrays by designing resonant structures is addressed. Examples involving both standard linear arrays of half-wavelength cylindrical dipoles and resonant linear arrays generating flat-top beam patterns are reported and discussed. Additionally, an extension to planar arrays performed by means of a generalisation of the Baklanov transformation through collapsed distribution techniques inspired in the well-known method devised by Tseng and Cheng is performed. In such a way, an analysis of the quality of solutions for generating circular and elliptical footprints with controlled both SLL and ripple which are highly interesting in the framework of space vehicle applications.

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Some aspects of the defect structure in an austenitic stainless steel

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100108714 ◽

1978 ◽

Vol 36 (1) ◽

pp. 314-315

Author(s):

R. Gonzalez ◽

L. Bru

Keyword(s):

Stainless Steel ◽

Austenitic Stainless Steel ◽

Cellular Structures ◽

Total Strain Amplitude ◽

Total Deformation ◽

Density Of Dislocations ◽

Planar Arrays ◽

Stacking Fault Tetrahedra ◽

Distribution Of Dislocations ◽

Very High

The analysis of stacking fault tetrahedra (SFT) in fatigued metals (1,2) is somewhat complicated, due partly to their relatively low density, but principally to the presence of a very high density of dislocations which hides them. In order to overcome this second difficulty, we have used in this work an austenitic stainless steel that deforms in a planar mode and, as expected, examination of the substructure revealed planar arrays of dislocation dipoles rather than the cellular structures which appear both in single and polycrystals of cyclically deformed copper and silver. This more uniform distribution of dislocations allows a better identification of the SFT.The samples were fatigue deformed at the constant total strain amplitude Δε = 0.025 for 5 cycles at three temperatures: 85, 293 and 773 K. One of the samples was tensile strained with a total deformation of 3.5%.

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Performance and applications of a field-emission gun TEM/STEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100129346 ◽

1992 ◽

Vol 50 (2) ◽

pp. 942-943

Author(s):

Judith M. Brock ◽

Max T. Otten ◽

Marc. J.C. de Jong

Keyword(s):

Field Emission ◽

High Resolution Imaging ◽

High Quality ◽

Small Energy ◽

High Brightness ◽

Small Probe ◽

Resolution Imaging ◽

Convergent Beam ◽

Beam Patterns ◽

Beam Diffraction

A Field Emission Gun (FEG) on a TEM/STEM instrument provides a major improvement in performance relative to one equipped with a LaB6 emitter. The improvement is particularly notable for small-probe techniques: EDX and EELS microanalysis, convergent beam diffraction and scanning. The high brightness of the FEG (108 to 109 A/cm2srad), compared with that of LaB6 (∼106), makes it possible to achieve high probe currents (∼1 nA) in probes of about 1 nm, whilst the currents for similar probes with LaB6 are about 100 to 500x lower. Accordingly the small, high-intensity FEG probes make it possible, e.g., to analyse precipitates and monolayer amounts of segregation on grain boundaries in metals or ceramics (Fig. 1); obtain high-quality convergent beam patterns from heavily dislocated materials; reliably detect 1 nm immuno-gold labels in biological specimens; and perform EDX mapping at nm-scale resolution even in difficult specimens like biological tissue.The high brightness and small energy spread of the FEG also bring an advantage in high-resolution imaging by significantly improving both spatial and temporal coherence.

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Structure Information From Electron Diffraction Intensities

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100136180 ◽

1990 ◽

Vol 48 (2) ◽

pp. 516-517

Author(s):

J. Gjønnes ◽

N. Bøe ◽

K. Gjønnes

Keyword(s):

Computational Effort ◽

Unit Cell ◽

Small Unit ◽

Structure Information ◽

Dispersion Surface ◽

Integrated Intensity ◽

The One ◽

Image Position ◽

Convergent Beam ◽

Beam Patterns

Structure information of high precision can be extracted from intentsity details in convergent beam patterns like the one reproduced in Fig 1. From low order reflections for small unit cell crystals,bonding charges, ionicities and atomic parameters can be derived, (Zuo, Spence and O’Keefe, 1988; Zuo, Spence and Høier 1989; Gjønnes, Matsuhata and Taftø, 1989) , but extension to larger unit cell ma seem difficult. The disks must then be reduced in order to avoid overlap calculations will become more complex and intensity features often less distinct Several avenues may be then explored: increased computational effort in order to handle the necessary many-parameter dynamical calculations; use of zone axis intensities at symmetry positions within the CBED disks, as in Figure 2 measurement of integrated intensity across K-line segments. In the last case measurable quantities which are well defined also from a theoretical viewpoint can be related to a two-beam like expression for the intensity profile:With as an effective Fourier potential equated to a gap at the dispersion surface, this intensity can be integrated across the line, with kinematical and dynamical limits proportional to and at low and high thickness respctively (Blackman, 1939).

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convergent-beam diffraction from surfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100125208 ◽

1987 ◽

Vol 45 ◽

pp. 30-33

Author(s):

J. A. Eades ◽

A. E. Smith ◽

D. F. Lynch

Keyword(s):

Reciprocal Lattice ◽

Three Dimensional ◽

Grazing Incidence ◽

Three Dimensions ◽

Plane Figure ◽

Transmission Electron ◽

Convergent Beam ◽

Beam Patterns ◽

Beam Diffraction

It is quite simple (in the transmission electron microscope) to obtain convergent-beam patterns from the surface of a bulk crystal. The beam is focussed onto the surface at near grazing incidence (figure 1) and if the surface is flat the appropriate pattern is obtained in the diffraction plane (figure 2). Such patterns are potentially valuable for the characterization of surfaces just as normal convergent-beam patterns are valuable for the characterization of crystals.There are, however, several important ways in which reflection diffraction from surfaces differs from the more familiar electron diffraction in transmission.GeometryIn reflection diffraction, because of the surface, it is not possible to describe the specimen as periodic in three dimensions, nor is it possible to associate diffraction with a conventional three-dimensional reciprocal lattice.

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