Edward Charrier: Need to understand pattern roughness leads to computational metrology startup
Keyword(s):
1998 ◽
Vol 08
(04)
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pp. 467-482
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Keyword(s):
2005 ◽
Vol 45
(4-5)
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pp. 591-596
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Keyword(s):
2003 ◽
Vol 13
(03)
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pp. 231-240
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Keyword(s):
2006 ◽
Vol 7
(1)
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pp. 3-9
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