Aspheric surface profile effects analysis in polishing with ballonet polishing tool

2012 ◽  
Author(s):  
Feng Zhang ◽  
Yun-long Zhang ◽  
Wen-jie Kang ◽  
Ying Su ◽  
Chao-ping Chen ◽  
...  
2018 ◽  
Vol 792 ◽  
pp. 179-184 ◽  
Author(s):  
Ming Feng ◽  
Yong Bo Wu ◽  
Teruo Bitoh ◽  
Tsunehisa Suzuki ◽  
Mitsuyoshi Nomura ◽  
...  

Previous researches have confirmed that MCF (magnetic compound fluid) slurry shows outstanding performance in the nanoprecision polishing of flat surfaces and V-grooves. However, no investigations have been conducted on the polishing of aspheric surfaces using MCF slurry. In this work, a novel method employing a doughnut-shaped MCF polishing tool and a 6-DOF manipulator has been proposed for the aspheric surface polishing. The time consumption for forming stable polishing tool and its final appearance are investigated. Flat aluminum alloy workpieces that can be considered as a kind of aspheric elements with infinite curve radius were adopted in the investigation of the polished forces under variable parameters. As a typical experimental result, with MCF3 slurry, 2.5ml volume of supplied slurry and work gap 3.5 mm, the surface roughness Ra decreases from 125nm to almost 10nm after 90 min polishing, confirming that the proposed method has the potential to polish aspheric surfaces.


Author(s):  
Qizhi Zhao ◽  
Lei Zhang ◽  
Yanjun Han ◽  
Cheng Fan

As a new polishing method, bonnet polishing is suitable for polishing the curved surface due to its advantages in flexibility and adaptability of the polishing tool. In the polishing process, the contact state between the bonnet and the curved surface always changes. The traditional polishing tool path with equal interval will inevitably lead to over-polished areas and unpolished areas. In this article, a new tool path for bonnet polishing, which is called the revised Archimedes spiral polishing path, is proposed to ensure the physical uniform coverage of the curved surface in bonnet polishing. The path generation method is based on the modified tool–workpiece contact model and the pointwise searching algorithm. To prove the effectiveness of the revised path, two aspheric workpieces were polished along the traditional Archimedes spiral polishing path and the revised path, respectively. The roughnesses of the two workpieces are 10.94 and 10 nm, and the profile tolerances are 0.4097 and 0.2037 μm, respectively. The experimental results show that the revised path achieves lower roughness and surface tolerance than the traditional Archimedes path, which indicates that the revised path can achieve uniform physical coverage on the surface.


2012 ◽  
Author(s):  
Yun-long Zhang ◽  
Feng Zhang ◽  
Jin-rui Yan ◽  
Ying Su ◽  
Rui Guo ◽  
...  

2008 ◽  
Vol 46 (9-12) ◽  
pp. 845-862 ◽  
Author(s):  
A. Shibuya ◽  
Y. Arai ◽  
Y. Yoshikawa ◽  
W. Gao ◽  
Y. Nagaike ◽  
...  

2021 ◽  
Author(s):  
Zhimin Rao ◽  
Haitao Liu ◽  
Jieli Wu ◽  
Qiang Chen ◽  
Dailu Wang

2014 ◽  
Vol 81 (12) ◽  
pp. 714 ◽  
Author(s):  
M. A. Abdulkadyrov ◽  
V. E. Patrikeev ◽  
A. P. Semenov

2008 ◽  
Vol 381-382 ◽  
pp. 175-178 ◽  
Author(s):  
Yoshikazu Arai ◽  
Atsushi Shibuya ◽  
Y. Yoshikawa ◽  
Wei Gao

A novel scanning probe measurement system has been developed to achieve precise profile measurements of micro-aspheric surfaces. The system consists of a scanning stage (a spindle and a linear slide) and a sensor unit. The sensor unit consists of a ring artifact, two capacitance sensors and a contact-mode displacement sensor. The two capacitance sensors scan the surface of the ring artifact to measure and compensate the error motions of the scanning stage while the contact-mode displacement sensor scans the surface of a micro-aspheric. In this paper, a new contact-mode displacement sensor that has a small contact force of less than 2.3 mN and a stable output has been developed. After investigating the fundamental performance of the contact-mode displacement sensor, the sensor has been applied to the micro-aspheric surface profile measurement system. The effectiveness of the measurement system has been verified by the measurement results.


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