Concepts For Electron-Beam And Optical Control Of Bulk Semiconductor Switches

1987 ◽  
Author(s):  
K. Schoenbach ◽  
R. Germer ◽  
V. Lakdawala ◽  
K. Schmitt ◽  
S. Albin
Keyword(s):  
Electron Beam ◽  
Optical Control ◽  
Semiconductor Switches ◽  
Bulk Semiconductor

Optical and electron-beam control of semiconductor switches

2003 ◽  
Author(s):  
K. Schoenbach ◽  
V. Lakdawala ◽  
S. Ko ◽  
M. Mazzola ◽  
D. Stoudt ◽  
...  
Keyword(s):  
Electron Beam ◽  
Beam Control ◽  
Semiconductor Switches

Sudden breakdown of bulk semiconductor switches

1993 ◽  
Author(s):  
Ralf P. Brinkmann ◽  
Karl H. Schoenbach ◽  
David C. Stoudt ◽  
Randy A. Roush
Keyword(s):  
Semiconductor Switches ◽  
Bulk Semiconductor

Bulk Semiconductor Switches and Phase Shifters

1968 ◽  
Author(s):  
K.E. Mortenson ◽  
J.F. White ◽  
A. Armstrong ◽  
J. Borrego
Keyword(s):  
Phase Shifters ◽  
Semiconductor Switches ◽  
Bulk Semiconductor

Electron-beam-controlled high-power semiconductor switches

1989 ◽  
Vol 36 (9) ◽  
pp. 1793-1802 ◽  
Author(s):  
K.H. Schoenbach ◽  
V.K. Lakdawala ◽  
D.C. Stoudt ◽  
T.F. Smith ◽  
R.P. Brinkmann
Keyword(s):  
Electron Beam ◽  
High Power ◽  
Power Semiconductor ◽  
Semiconductor Switches

Electron-Beam Controlled Semiconductor Switches

1988 ◽  
Author(s):  
K. I. Schoenbach ◽  
V. K. Lakdawala ◽  
K. B. Schmitt ◽  
T. J. Powers
Keyword(s):  
Electron Beam ◽  
Semiconductor Switches

Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

1971 ◽  
Vol 29 ◽  
pp. 204-205
Author(s):  
G. G. Shaw
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Aluminum Alloy ◽  
Electron Beam ◽  
Pure Aluminum ◽  
Ion Milling ◽  
Transmission Electron ◽  
Fiber Matrix ◽  
Ion Erosion ◽  
Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

Sign in / Sign up

Export Citation Format

Share Document