Vacuum Interface To A Soft X-Ray Synchrotron Beam Line

1986 ◽  
Author(s):  
Ping-Po Gong ◽  
Richard T. Thompson ◽  
Bob A. Smith
1995 ◽  
Vol 34 (16) ◽  
pp. 3024 ◽  
Author(s):  
James E. Harvey ◽  
Kristin L. Lewotsky ◽  
Anita Kotha

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-135-C8-137
Author(s):  
T. MURATA ◽  
T. MATSUKAWA ◽  
M. MORI ◽  
M. OBASHI ◽  
S.-I. NAO-E ◽  
...  

1992 ◽  
pp. 995-1000 ◽  
Author(s):  
J. V. Gilfrich ◽  
E. F. Skelton ◽  
S. B. Qadri ◽  
N. E. Moulton ◽  
D. J. Nagel ◽  
...  

2005 ◽  
Vol 37 (1) ◽  
pp. 27-34 ◽  
Author(s):  
S. Paris ◽  
E. Gaffet ◽  
D. Vrel ◽  
D. Thiaudiere ◽  
M. Gailhanou ◽  
...  

The control of Mechanically Activated Field Activated Pressure Assisted Synthesis hereafter called the MAFAPAS process is the main objective to be achieved for producing nanostructure materials with a controlled consolidation level. Consequently, it was essential to develop characterization tools "in situ" such as the Time Resolved X-ray Diffraction (TRXRD), with an X-ray synchrotron beam (H10, LURE Orsay) coupled to an infrared thermography to study simultaneously structural transformations and thermal evolutions. From the 2003 experiments, we took the opportunity to modify the sample-holder in order to reproduce the better synthesis conditions of the MAFAPAS process, but without the consolidation step. The versatility of the setup has been proved and could even be enhanced by the design of new sample holders. In addition, this work clearly shows that this equipment will allow, on the one hand, to make progress of the understanding of MAFAPAS mechanisms and, on the other hand, to adjust reaction parameters (mechanical activation and combustion synthesis) for producing many materials with an expected microstructure.


1998 ◽  
Vol 08 (02n03) ◽  
pp. 209-216 ◽  
Author(s):  
S. MATSUYAMA ◽  
K. GOTOH ◽  
K. ISHII ◽  
H. YAMAZAKI ◽  
T. SATOH ◽  
...  

We developed a PIXE analysis system which provides spatial distribution images of elements in a region of several cm2 with a spatial resolution of < 0.5 mm. We call this system a submilli-PIXE camera. This system consists of a submilli-beam line, beam scanners and a data acquisition system in which the X-ray energy and the beam position are simultaneously measured. We demonstrate the usefulness of the submilli-PIXE camera by analyzing the surface of a shell and of granite.


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