Synchrotron Radiation Beam Lines As X-Ray Calibration Sources

1986 ◽  
Author(s):  
J. P. Kirkland ◽  
R. A. Neiser ◽  
W. T. Elam ◽  
J. C. Rife ◽  
W. R. Hunter
Keyword(s):  
Synchrotron Radiation ◽  
Synchrotron Radiation Beam ◽  
Radiation Beam ◽  
X Ray

Direct Observation of Diffraction Arcs from Nanoscale Precipitates in Steels by Highly Brilliant and Focused Synchrotron Radiation Beam and Imaging Plate

1994 ◽  
Vol 332 ◽  
Author(s):  
Yasuo Takagi ◽  
Yoshitaka Okitsu ◽  
Toshiyasu Ukena
Keyword(s):  
Synchrotron Radiation ◽  
Direct Observation ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Imaging Plate ◽  
Synchrotron Radiation Beam ◽  
Radiation Beam ◽  
X Ray ◽  
The Matrix ◽  
First Time

ABSTRACTDirect observation of diffraction arcs by X-ray from nanoscale precipitates in steels has become possible for the first time by using a highly brilliant and focused synchrotron radiation beam at BL3A of Photon Factory, and also by using an “imaging plate”, a two dimensional X-ray detector which has a wide dynamic range and high sensitivity. For examples, most of the diffraction arcs from ε-Cu precipitates (∼200 Å in diameter and ∼1 at. % in concentration) in Cu-added steels were observed. The method can apply to nondestructive and in-situ observation of creation and growth processes of the precipitates which has close relationships to various physical properties of the matrix steels.

scholarly journals Controlling X-ray beam trajectory with a flexible hollow glass fibre

2013 ◽  
Vol 21 (1) ◽  
pp. 61-65 ◽  
Author(s):  
Yoshihito Tanaka ◽  
Takashi Nakatani ◽  
Rena Onitsuka ◽  
Kei Sawada ◽  
Isao Takahashi
Keyword(s):  
Synchrotron Radiation ◽  
Glass Fibre ◽  
Metal Film ◽  
Transmission Efficiency ◽  
Total Reflection ◽  
Synchrotron Radiation Beam ◽  
Radiation Beam ◽  
Hollow Glass ◽  
X Ray ◽  
Glancing Angle

A metre-length flexible hollow glass fibre with 20 µm-bore and 1.5 mm-cladding diameters for transporting a synchrotron X-ray beam and controlling the trajectory has been examined. The large cladding diameter maintains a moderate curvature to satisfy the shallow glancing angle of total reflection. The observed transmission efficiency was more than 20% at 12.4 keV. As a demonstration, a wide-area scan of a synchrotron radiation beam was performed to identify the elements for a fixed metal film through its absorption spectra.

Hard x-ray phase imaging using simple propagation of a coherent synchrotron radiation beam

1999 ◽  
Vol 32 (10A) ◽  
pp. A145-A151 ◽  
Author(s):  
Peter Cloetens ◽  
Wolfgang Ludwig ◽  
José Baruchel ◽  
Jean-Pierre Guigay ◽  
Petra Pernot-Rejmánková ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Synchrotron Radiation Beam ◽  
Phase Imaging ◽  
Radiation Beam ◽  
X Ray ◽  
Coherent Synchrotron Radiation

Studies of Molecular Orientation in Deformed Semicrystalline Polymers by X- Ray Scattering Employing Synchrotron Radiation

1986 ◽  
Vol 79 ◽  
Author(s):  
S. Röber ◽  
R. Gehrke ◽  
H. G. Zachmann
Keyword(s):  
Synchrotron Radiation ◽  
Molecular Orientation ◽  
Semicrystalline Polymers ◽  
Synchrotron Radiation Beam ◽  
X Rays ◽  
Radiation Beam ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

IntroductionThe possibility of using synchrotron radiation as a source of X-rays for scattering experiments has considerably improved the methods of the characterisation of the molecular orientation and molecular order in polymers. In another publication [1], it has been shown that the morphology of ultra highly drawn polyethylene is correlated to the kinetics of isothermal melting, as determined by X- ray scattering employing synchrotron radiation. In this paper we present some results on chain orientation and orientation of crystal lamellae surfaces in uniaxially and biaxially drawn films of polyethyleneterephthalate (PET). These results were obtained by inserting a pole figure goniometer into the synchrotron radiation beam and measuring the wide angle X-ray scattering (WAXS) and small angle X- ray scattering (SAXS) with different angles of incidence of the primary beam onto the sample.

Basal plane bending of 6H-SiC single crystals observed by synchrotron radiation X-ray topography

2009 ◽  
Vol 42 (6) ◽  
pp. 1068-1072 ◽  
Author(s):  
Lina Ning ◽  
Xiaobo Hu ◽  
Yingmin Wang ◽  
Xiangang Xu ◽  
Yuqiang Gao ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystals ◽  
Basal Plane ◽  
Synchrotron Radiation Beam ◽  
Radiation Beam ◽  
X Ray ◽  
Plane Bending ◽  
Spherical Curvature ◽  
Good Agreement

Basal plane bending is a structural defect in SiC single crystals caused mainly by the thermal mismatch between seed and holder, which deteriorates the quality of the wafers and blocks their applications. In this paper, basal plane bending was detected by high-resolution X-ray diffractometry (HRXRD) and transmission synchrotron white-beam X-ray topography (SWBXT). HRXRD reveals that the (0001) Si face is a concave sphere and SWBXT shows that the shapes of the Laue spots are different from that of the cross section of the synchrotron radiation beam. On the basis of a spherical curvature model for a (0001) 6H-SiC single crystal, the shapes of the Laue spots were simulated. The results are in good agreement with the experimental observations. Thus, SWBXT is an effective method for detecting basal plane bending.

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