High Temperature Millimeter Wave Dielectric Characterization Of Radome Materials

1983 ◽  
Author(s):  
W. W. Ho
Keyword(s):  
High Temperature ◽  
Millimeter Wave ◽  
Dielectric Characterization

scholarly journals Characterization of AlN-based ceramic composites for use as millimeter-wave susceptor materials at high temperature: Dielectric properties of AlN:Mo with 0.25 vol% to 4.0 vol% Mo from 25 to 550 °C

2019 ◽  
Vol 34 (15) ◽  
pp. 2573-2581 ◽  
Author(s):  
Brad W. Hoff ◽  
Steven C. Hayden ◽  
Martin S. Hilario ◽  
Rachael O. Grudt ◽  
Frederick W. Dynys ◽  
...  
Keyword(s):  
High Temperature ◽  
Dielectric Properties ◽  
Millimeter Wave ◽  
Ceramic Composites ◽  
Image Position

Abstract

scholarly journals Millimeter-wave sensor based on a λ/2-line resonator for identification and dielectric characterization of non-ionic surfactants

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
H. Rodilla ◽  
A. A. Kim ◽  
G. D. M. Jeffries ◽  
J. Vukusic ◽  
A. Jesorka ◽  
...  
Keyword(s):  
Millimeter Wave ◽  
Ionic Surfactants ◽  
Dielectric Characterization

Bulk and In-Circuit Dielectric Characterization of LTCC Tape Systems Through Millimeter Wave Frequency Range

2011 ◽  
Vol 2011 (1) ◽  
pp. 000740-000746 ◽  
Author(s):  
Bradley Thrasher ◽  
Deepukumar Nair ◽  
James Parisi ◽  
Glenn Oliver ◽  
Michael A. Smith
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Millimeter Wave ◽  
Design Stage ◽  
Frequency Range ◽  
Dielectric Thickness ◽  
Dielectric Characterization ◽  
Wide Range ◽  
Comprehensive Characterization

Low Temperature Co-fired Ceramic (LTCC) material systems offer a highly versatile microwave and millimeter wave packaging platform. Extremely low microwave loss, excellent control of dielectric constant, uniform dielectric thickness, non-existent water absorption leading to very high hermeticity, ability to support multilayer structure leading to 3-dimensional packaging, ability to embed passive functions within the tape layers, availability of a wide range of metallizations, etc. are some of the key advantages of LTCC for microwave packaging. One of the important parameters which needs to be determined at the very early stages of circuit designs are the dielectric properties - dielectric constant and loss tangent, both of which are functions of frequency. These properties need to be known accurately over the entire frequency range of operation for the circuit. For LTCC based designs, the use of dielectric constant of bulk material can lead to deviations between the performance expected at the design stage and for the fabricated circuit. Such deviations are a significant concern for broadband circuits as well as for circuits with sharp resonant behavior such as filters. One of the significant sources of deviation between bulk LTCC and “in-circuit” dielectric constant is the nature of the thick film metallizations used in LTCC technology. Work described here is a comprehensive characterization of three DuPont™ GreenTape™ LTCC systems 951, 943, and 9K7 - in the frequency range 10 to 70 GHz. Both bulk and “in-circuit” dielectric properties with silver and gold metallizations are studied to quantify the deviations in dielectric properties. A Fabry-Perot open resonator technique is used for the bulk characterization while printed ring resonators are used for the in-circuit characterization. This comprehensive characterization will provide key design data for LTCC designers in the 10 – 70 GHz frequency range.

Synthesis and dielectric characterization of BaZrNb2O8 high temperature piezoelectric ceramics

2019 ◽  
Author(s):  
Narendra Kumar Verma ◽  
Garima Kamde ◽  
Dinesh Kumar ◽  
Chandra Bhal Singh ◽  
Akhilesh Kumar Singh
Keyword(s):  
High Temperature ◽  
Piezoelectric Ceramics ◽  
Dielectric Characterization

Structural and dielectric characterization of sputtered Tantalum Titanium Oxide thin films for high temperature capacitor applications

2016 ◽  
Vol 606 ◽  
pp. 127-132 ◽  
Author(s):  
A. Rouahi ◽  
F. Challali ◽  
I. Dakhlaoui ◽  
C. Vallée ◽  
S. Salimy ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Titanium Oxide ◽  
Oxide Thin Films ◽  
Dielectric Characterization

High Temperature Thermal Analysis of Graphite and Silicon Carbide with Millimeter-Wave Radiometry

2011 ◽  
Vol 1298 ◽  
Author(s):  
Paul P. Woskov ◽  
S. K. Sundaram
Keyword(s):  
Thermal Analysis ◽  
Silicon Carbide ◽  
High Temperature ◽  
Millimeter Wave ◽  
Surface Displacement ◽  
Measurement Sensitivity ◽  
Anisotropic Surface ◽  
Real Time Measurement ◽  
Extreme High Temperature

ABSTRACTMillimeter-wave thermal analysis instrumentation is being developed for characterization of high temperature materials required for diverse fuel and structural needs in extreme high temperature reactor environments. A two-receiver 137 GHz system with orthogonal polarizations for anisotropic properties resolution has been implemented at MIT and is being tested with graphite and silicon carbide specimens at temperatures up to 1300ºC. Real time measurement sensitivity to submillimeter surface displacement and simulated anisotropic surface emissivity is demonstrated.

Microwave dielectric characterization of bulk ferroelectrics

1998 ◽  
Vol 08 (PR9) ◽  
pp. Pr9-113-Pr9-116 ◽  
Author(s):  
C. M. Weil ◽  
R. G. Geyer ◽  
L. Sengupta
Keyword(s):  
Dielectric Characterization ◽  
Microwave Dielectric
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