Laser-Induced Crystal Growth Measurements By Time-Resolved Optical Reflectivity

1981 ◽  
Author(s):  
G. L. Olson ◽  
S. A. Kokorowski ◽  
J. A. Roth ◽  
R. S. Turley ◽  
L. D. Hess
Keyword(s):  
Crystal Growth ◽  
Time Resolved ◽  
Optical Reflectivity

Direct Measurement of Cw Laser-Induced Crystal Growth Dynamics by Time-Resolved Optical Reflectivity

1980 ◽  
Vol 1 ◽  
Author(s):  
G.L. Olson ◽  
S.A. Kokorowski ◽  
J.A. Roth ◽  
L.D. Hess
Keyword(s):  
Crystal Growth ◽  
Solid Phase ◽  
Growth Dynamics ◽  
Time Resolved ◽  
Laser Method ◽  
Optical Reflectivity ◽  
Spatially Resolved ◽  
Use Of Time ◽  
Cw Laser

ABSTRACTWe report the use of time-resolved optical reflectivity to directly monitor the dynamics of cw laser-induced solid phase epitaxy (SPE) of thin films. This in situ measurement technique utilizes optical interference effects between light reflected from the surface of a sample and from an advancing interface to provide continuous temporal and spatial resolution of crystal growth processes. SPE growth rates of ionimplanted films which are five orders of magnitude faster than previously observed can be induced and accurately measured with the laser method. Arsenic enhances the SPE rate, and spatially resolved measurements show that the growth rate for arsenic implanted films varies in accordance with the ionimplantation profile. Results are reported for silicon selfimplanted samples with and without subsequent arsenic ion implantation, and for silicon samples directly implanted with arsenic.

scholarly journals Photoinduced two-step insulator–metal transition in Ti4O7 via ultrafast time-resolved optical reflectivity

2018 ◽  
Vol 11 (9) ◽  
pp. 095802 ◽  
Author(s):  
Xu-Chen Nie ◽  
Hai-Ying Song ◽  
Xiu Zhang ◽  
Shi-Bing Liu ◽  
Fan Li ◽  
...  
Keyword(s):  
Time Resolved ◽  
Optical Reflectivity ◽  
Insulator Metal Transition

Direct observation of laser‐induced solid‐phase epitaxial crystallization by time‐resolved optical reflectivity

1980 ◽  
Vol 37 (11) ◽  
pp. 1019-1021 ◽  
Author(s):  
G. L. Olson ◽  
S. A. Kokorowski ◽  
R. A. McFarlane ◽  
L. D. Hess
Keyword(s):  
Direct Observation ◽  
Solid Phase ◽  
Time Resolved ◽  
Epitaxial Crystallization ◽  
Optical Reflectivity

Controlling Zeolitic Imidazolate Framework Nano- and Microcrystal Formation: Insight into Crystal Growth by Time-Resolved In Situ Static Light Scattering

2011 ◽  
Vol 23 (8) ◽  
pp. 2130-2141 ◽  
Author(s):  
Janosch Cravillon ◽  
Roman Nayuk ◽  
Sergej Springer ◽  
Armin Feldhoff ◽  
Klaus Huber ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Light Scattering ◽  
Static Light Scattering ◽  
Zeolitic Imidazolate Framework ◽  
Time Resolved ◽  
Insight Into

scholarly journals Evaluation of microflow configurations for scale inhibition and serial X-ray diffraction analysis of crystallization processes

Lab on a Chip ◽  
2020 ◽  
Vol 20 (16) ◽  
pp. 2954-2964
Author(s):  
Mark A. Levenstein ◽  
Yi-Yeoun Kim ◽  
Liam Hunter ◽  
Clara Anduix-Canto ◽  
Carlos González Niño ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Scale Inhibition ◽  
Serial Crystallography

Exploration of crystal growth in microchannels led to effective scale inhibition, enabling time-resolved injector-based serial crystallography-on-a-chip.

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