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Development of surface profile measurement method for ellipsoidal x-ray mirrors using phase retrieval
Mapping Intimacies
◽
10.1117/12.930340
◽
2012
◽
Cited By ~ 4
Author(s):
Takahiro Saitou
◽
Yoshinori Takei
◽
Hidekazu Mimura
Keyword(s):
Measurement Method
◽
Phase Retrieval
◽
Surface Profile
◽
Profile Measurement
◽
X Ray
◽
Surface Profile Measurement
Download Full-text
Related Documents
Cited By
References
Surface profile measurement from intensity of diffracted light using the phase retrieval method
Applied Optics
◽
10.1364/ao.24.002696
◽
1985
◽
Vol 24
(16)
◽
pp. 2696
◽
Cited By ~ 3
Author(s):
Osami Sasaki
◽
Yutaka Fukuhara
Keyword(s):
Phase Retrieval
◽
Surface Profile
◽
Profile Measurement
◽
Retrieval Method
◽
Surface Profile Measurement
Download Full-text
Laser differential confocal inner-surface profile measurement method for an ICF capsule
Optics Express
◽
10.1364/oe.25.028510
◽
2017
◽
Vol 25
(23)
◽
pp. 28510
◽
Cited By ~ 6
Author(s):
Longxiao Wang
◽
Lirong Qiu
◽
Weiqian Zhao
◽
Xianxian Ma
◽
Shaobai Li
◽
...
Keyword(s):
Measurement Method
◽
Surface Profile
◽
Profile Measurement
◽
Inner Surface
◽
Surface Profile Measurement
Download Full-text
Accuracy in surface profile measurement by x-ray methods
Measurement Techniques
◽
10.1007/bf00863953
◽
1986
◽
Vol 29
(8)
◽
pp. 717-720
Author(s):
N. P. Valuev
◽
F. L. Gerchikov
◽
V. D. Kosarev
◽
V. K. Latyshev
◽
Yu. V. Moish
◽
...
Keyword(s):
Surface Profile
◽
Profile Measurement
◽
X Ray
◽
Ray Methods
◽
Surface Profile Measurement
Download Full-text
Optical surface profile measurement using phase retrieval by tuning the illumination wavelength
Optics Communications
◽
10.1016/j.optcom.2012.08.018
◽
2012
◽
Vol 285
(24)
◽
pp. 5029-5036
◽
Cited By ~ 6
Author(s):
Peng Bao
◽
Giancarlo Pedrini
◽
Wolfgang Osten
Keyword(s):
Phase Retrieval
◽
Surface Profile
◽
Profile Measurement
◽
Optical Surface
◽
Illumination Wavelength
◽
Surface Profile Measurement
Download Full-text
A Dual-Lens Laser Surface Profile Measurement Method for Solving the Problem of Light Stripe Occlusion
Chinese Journal of Lasers
◽
10.3788/cjl202047.1104002
◽
2020
◽
Vol 47
(11)
◽
pp. 1104002
Author(s):
王蔚松 Wang Weisong
◽
王新宇 Wang Xinyu
◽
李盼园 Li Panyuan
◽
史祎诗 Shi Yishi
Keyword(s):
Measurement Method
◽
Surface Profile
◽
Laser Surface
◽
Profile Measurement
◽
Surface Profile Measurement
Download Full-text
Development of Phase-retrieval measuring System for 3D Micromachined Surface Profile Measurement
The proceedings of the JSME annual meeting
◽
10.1299/jsmemecjo.2002.5.0_289
◽
2002
◽
Vol 2002.5
(0)
◽
pp. 289-290
Author(s):
Yasuhiro TAKAYA
◽
Atsushi TAGUCHI
◽
Satoru TAKAHASHI
◽
Takashi MIYOSHI
Keyword(s):
Phase Retrieval
◽
Surface Profile
◽
Measuring System
◽
Profile Measurement
◽
Surface Profile Measurement
Download Full-text
Fiber-optic interferometer for surface profile measurement with vibration suppression
Optics Express
◽
10.1364/oe.19.004223
◽
2011
◽
Vol 19
(5)
◽
pp. 4223
Author(s):
Taekmin Kwon
◽
Seung-Woo Kim
Keyword(s):
Fiber Optic
◽
Vibration Suppression
◽
Surface Profile
◽
Profile Measurement
◽
Fiber Optic Interferometer
◽
Surface Profile Measurement
Download Full-text
Pre-correction of projected gratings for surface profile measurement
10.1117/12.839317
◽
2008
◽
Cited By ~ 1
Author(s):
Cuiru Sun
◽
Hua Lu
Keyword(s):
Surface Profile
◽
Profile Measurement
◽
Surface Profile Measurement
Download Full-text
Large surface profile measurement with instantaneous phase-shifting interferometry
Optical Engineering
◽
10.1117/1.1532331
◽
2003
◽
Vol 42
(2)
◽
pp. 367
◽
Cited By ~ 22
Author(s):
N. R. Sivakumar
Keyword(s):
Surface Profile
◽
Phase Shifting
◽
Profile Measurement
◽
Instantaneous Phase
◽
Phase Shifting Interferometry
◽
Surface Profile Measurement
Download Full-text
Light source with orthogonally linear polarized two‐frequency beam from laser diode and surface profile measurement
Optical Engineering
◽
10.1117/1.600714
◽
1996
◽
Vol 35
(4)
◽
pp. 1070
◽
Cited By ~ 6
Author(s):
Yukitoshi Otani
Keyword(s):
Light Source
◽
Laser Diode
◽
Surface Profile
◽
Profile Measurement
◽
Surface Profile Measurement
Download Full-text
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