Development of surface profile measurement method for ellipsoidal x-ray mirrors using phase retrieval

Author(s):  
Takahiro Saitou ◽  
Yoshinori Takei ◽  
Hidekazu Mimura
2017 ◽  
Vol 25 (23) ◽  
pp. 28510 ◽  
Author(s):  
Longxiao Wang ◽  
Lirong Qiu ◽  
Weiqian Zhao ◽  
Xianxian Ma ◽  
Shaobai Li ◽  
...  

1986 ◽  
Vol 29 (8) ◽  
pp. 717-720
Author(s):  
N. P. Valuev ◽  
F. L. Gerchikov ◽  
V. D. Kosarev ◽  
V. K. Latyshev ◽  
Yu. V. Moish ◽  
...  

2020 ◽  
Vol 47 (11) ◽  
pp. 1104002
Author(s):  
王蔚松 Wang Weisong ◽  
王新宇 Wang Xinyu ◽  
李盼园 Li Panyuan ◽  
史祎诗 Shi Yishi

2002 ◽  
Vol 2002.5 (0) ◽  
pp. 289-290
Author(s):  
Yasuhiro TAKAYA ◽  
Atsushi TAGUCHI ◽  
Satoru TAKAHASHI ◽  
Takashi MIYOSHI

Sign in / Sign up

Export Citation Format

Share Document