Ultrahigh 22-nm resolution EUV coherent diffraction imaging using a tabletop 13-nm high harmonic source
2014 ◽
Keyword(s):
Oversampling smoothness: an effective algorithm for phase retrieval of noisy diffraction intensities
2013 ◽
Vol 46
(2)
◽
pp. 312-318
◽
Keyword(s):
X Ray
◽
2012 ◽
Vol 46
(1)
◽
pp. 234-241
◽
2021 ◽