Intra-cell process variability and compact modeling of LWR effects: from self-aligned multiple patterning to multiple-gate MOSFETs

2012 ◽  
Author(s):  
Yijian Chen ◽  
Weiling Kang ◽  
Qi Cheng
Keyword(s):  
Cell Process ◽  
Compact Modeling ◽  
Process Variability

Dry chip feedrate control using online chip moisture

TAPPI Journal ◽  
2018 ◽  
Vol 17 (05) ◽  
pp. 295-305
Author(s):  
Wesley Gilbert ◽  
Ivan Trush ◽  
Bruce Allison ◽  
Randy Reimer ◽  
Howard Mason
Keyword(s):  
Production Rate ◽  
Control Strategy ◽  
Rate Control ◽  
Near Infrared ◽  
Dry Mass ◽  
The Other ◽  
Process Variability ◽  
Moisture Sensor ◽  
Feedback Control Strategy ◽  
And Control

Normal practice in continuous digester operation is to set the production rate through the chip meter speed. This speed is seldom, if ever, adjusted except to change production, and most of the other digester inputs are ratioed to it. The inherent assumption is that constant chip meter speed equates to constant dry mass flow of chips. This is seldom, if ever, true. As a result, the actual production rate, effective alkali (EA)-to-wood and liquor-to-wood ratios may vary substantially from assumed values. This increases process variability and decreases profits. In this report, a new continuous digester production rate control strategy is developed that addresses this shortcoming. A new noncontacting near infrared–based chip moisture sensor is combined with the existing weightometer signal to estimate the actual dry chip mass feedrate entering the digester. The estimated feedrate is then used to implement a novel feedback control strategy that adjusts the chip meter speed to maintain the dry chip feedrate at the target value. The report details the results of applying the new measurements and control strategy to a dual vessel continuous digester.

Measurement and Compact Modeling of 1/f Noise in HV-MOSFETs

2013 ◽  
Vol 60 (2) ◽  
pp. 670-676 ◽  
Author(s):  
Nikolaos Mavredakis ◽  
Matthias Bucher ◽  
Roland Friedrich ◽  
Antonios Bazigos ◽  
François Krummenacher ◽  
...  
Keyword(s):  
Compact Modeling

Improved Compact Modeling of SiGe HBT Linearity With MEXTRAM

2021 ◽  
pp. 1-7
Author(s):  
Huaiyuan Zhang ◽  
Guofu Niu ◽  
Marnix B. Willemsen ◽  
Andries J. Scholten
Keyword(s):  
Compact Modeling ◽  
Sige Hbt

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

2021 ◽  
Author(s):  
Alexandra Zimpeck ◽  
Cristina Meinhardt ◽  
Laurent Artola ◽  
Ricardo Reis
Keyword(s):  
Soft Errors ◽  
Process Variability

Self-consistent 2D compact modeling of nanoscale bulk MOSFETs

2007 ◽  
Vol 51 (5) ◽  
pp. 739-748 ◽  
Author(s):  
Alexander Kloes ◽  
Michaela Weidemann
Keyword(s):  
Compact Modeling ◽  
Self Consistent

Compact Modeling of Organic and IGZO TFTs from 150 to 350K

2021 ◽  
Author(s):  
Benjamin Iniguez ◽  
Harold Cortes-Ordonez ◽  
Gerard Ghibaudo ◽  
Antonio Cerdeira ◽  
Magali Estrada
Keyword(s):  
Compact Modeling
Sign in / Sign up

Export Citation Format

Share Document