Comparison study for 3x-nm contact hole CD uniformity between EUV lithography and ArF immersion double patterning

Author(s):  
Keundo Ban ◽  
Junggun Heo ◽  
Hyunkyung Shim ◽  
Minkyung Park ◽  
Kilyoung Lee ◽  
...  
Author(s):  
Weimin Gao ◽  
Vincent Wiaux ◽  
Wolfgang Hoppe ◽  
Lawrence S. Melvin ◽  
Vicky Philipsen ◽  
...  

2016 ◽  
Vol 4 (2) ◽  
pp. 202-218
Author(s):  
ڕێبوار محمد احمد ◽  
◽  
هێمن محمد عزیز ◽  
بصيرة ماجيد نجم ◽  
◽  
...  

2000 ◽  
Author(s):  
N. Wegener ◽  
D. Lillquist ◽  
M. Taylor
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document