Lightweight and high angular resolution x-ray optics for astronomy

Author(s):  
William W. Zhang
2012 ◽  
Author(s):  
W. W. Zhang ◽  
M. P. Biskach ◽  
P. N. Blake ◽  
K.-W. Chan ◽  
J. A. Gaskin ◽  
...  

2008 ◽  
Author(s):  
M. Bavdaz ◽  
D. Lumb ◽  
K. Wallace ◽  
E.-J. Buis ◽  
G. Vacanti ◽  
...  

Author(s):  
Michael Biskach ◽  
Timo Saha ◽  
William Zhang ◽  
James Mazzarella ◽  
Ryan McClelland ◽  
...  

Next generation X-ray telescopes in the coming decades require optics with high angular resolution and large collecting area at a fixed cost and budget. X-ray optics, unlike traditional normal incidence optics in optical and infrared telescopes, require many times the polished surface area to obtain an equivalent collecting area due to the nature of glancing incidence optics necessary to reflect higher energy X-ray photons. The Next Generation X-ray Optics (NGXO) group at NASA Goddard Space Flight Center (GSFC) is developing a manufacturing process capable of producing sub 5 arc-second half-power diameter (HPD) angular resolution optics in the near term, with the long term goal of producing optics for an X-ray telescope in the next 10 years with sub 1 arc-second HPD angular resolution. By parallelizing the production, integration, and testing of X-ray mirrors in separate modules, thousands of precisely formed X-ray mirror segments are assembled into one Mirror Assembly (MA), lowering the cost per collecting area by orders of magnitude compared to previous X-ray telescopes with similar resolution like the Chandra X-ray Observatory. Novel uses of kinematic mounts, precision actuators, and epoxy fixes each X-ray mirror segment to the submicron level with the sufficient strength to survive rocket launch.


2012 ◽  
Vol 23 (7) ◽  
pp. 074015 ◽  
Author(s):  
F Siewert ◽  
J Buchheim ◽  
T Höft ◽  
S Fiedler ◽  
G Bourenkov ◽  
...  

2011 ◽  
Author(s):  
W. W. Zhang ◽  
M. P. Biskach ◽  
P. N. Blake ◽  
K. W. Chan ◽  
T. C. Evans ◽  
...  

2008 ◽  
Author(s):  
Charlotte Feldman ◽  
Richard Willingale ◽  
Carolyn Atkins ◽  
Hongchang Wang ◽  
Peter Doel ◽  
...  

Author(s):  
Bianca Salmaso ◽  
Stefano Basso ◽  
Marta M. Civitani ◽  
Mauro Ghigo ◽  
Joanna Holyszko ◽  
...  

2001 ◽  
Vol 7 (S2) ◽  
pp. 354-355
Author(s):  
Nestor J. Zaluzec ◽  
Katherine L. Smith

It has been long known that orientation effects in crystalline materials can influence characteristic x-ray emission and microanalysis1-7. High Angular Resolution Electron Channeling X-ray Spectroscopy (HARECXS)6-7. a variation of ALCHEMI4-5, has been used at ANL for the last few years to investigate the effects of channeling on quantitative XEDS analysis of materials. More recently we have also been using HARECXS to carefully measure elemental disordering in a number of systems and have found that it can be used very successfully to elucidate the various stages of disorder.Perovskite (nominally CaTiO3) is a host phase for actinides in various wasteforms for the immobilization of high level radioactive nuclear waste. Over geologic time, alpha decay damage of the actinides in perovskite will cause displacive effects that influence the dimensional and chemical stability of the wasteform. in the past, the progression of damage has been studied by monitoring changes in selected area electron diffraction (SAED) patterns with increasing dose (e.g. 11).


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