Techniques for improving material fidelity and contrast consistency in secondary electron mode helium ion microscope (HIM) imaging

2010 ◽  
Author(s):  
William Thompson ◽  
Lewis Stern ◽  
Dave Ferranti ◽  
Chuong Huynh ◽  
Larry Scipioni ◽  
...  
Keyword(s):  
Secondary Electron ◽  
Helium Ion ◽  
Secondary Electron Mode ◽  
Electron Mode

Helium Ion Secondary Electron Mode Microscopy For Interconnect Material Imaging

2010 ◽  
Vol 49 (4) ◽  
pp. 04DB12 ◽  
Author(s):  
Shinichi Ogawa ◽  
William Thompson ◽  
Lewis Stern ◽  
Larry Scipioni ◽  
John Notte ◽  
...  
Keyword(s):  
Secondary Electron ◽  
Helium Ion ◽  
Secondary Electron Mode ◽  
Electron Mode ◽  
Interconnect Material

Evaluating the Use of Synthetic Replicas for SEM Identification of Bloodstains (with Emphasis on Archaeological and Ethnographic Artifacts)

2015 ◽  
Vol 21 (6) ◽  
pp. 1504-1513 ◽  
Author(s):  
Policarp Hortolà
Keyword(s):  
Blood Cells ◽  
Secondary Electron ◽  
Raw Materials ◽  
High Vacuum ◽  
Legal Issues ◽  
Raw Material ◽  
Organic Residues ◽  
Direct Examination ◽  
Secondary Electron Mode ◽  
Electron Mode

AbstractSome archaeological or ethnographic specimens are unavailable for direct examination using a scanning electron microscope (SEM) due to methodological obstacles or legal issues. In order to assess the feasibility of using SEM synthetic replicas for the identification of bloodstains (BSs) via morphology of red blood cells (RBCs), three fragments of different natural raw material (inorganic, stone; plant, wood; animal, shell) were smeared with peripheral human blood. Afterwards, molds and casts of the bloodstained areas were made using vinyl polysiloxane (VPS) silicone impression and polyurethane (PU) resin casting material, respectively. Then, the original samples and the resulting casts were coated with gold and examined in secondary-electron mode using a high-vacuum SEM. Results suggest that PU resin casts obtained from VPS silicone molds can preserve RBC morphology in BSs, and consequently that synthetic replicas are feasible for SEM identification of BSs on cultural heritage specimens made of natural raw materials. Although the focus of this study was on BSs, the method reported in this paper may be applicable to organic residues other than blood, as well as to the surface of other specimens when, for any reason, the original is unavailable for an SEM.

A Micromanipulator for Use in the Column of a Scanning Electron Microscope

1972 ◽  
Vol 30 ◽  
pp. 372-373
Author(s):  
James B. Pawley
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Secondary Electron ◽  
Surface Hardness ◽  
Micro Scale ◽  
Macroscopic Object ◽  
Secondary Electron Mode ◽  
Electron Mode ◽  
Scanning Electron

Used in the secondary electron mode, the Scanning Electron Microscope (SEM) produces an image of the outside surface of a microscopic sample which looks very similar to what one might expect to see if the sample was a diffusely illuminated macroscopic object viewed with the unaided eye. Part of the familiarity of such an image is associated with the fact that one seems to look at the sample rather than through it, as in the case with the conventional electron microscope or the high resolution light microscope. A resulting limitation is the fact that an object of interest cannot be observed if it is below the outer surface. It has been shown (Gane and Bowden 1968) that useful surface hardness information can be obtained on a micro scale by observing the deformation produced when a small stylus, attached to a D'Arsonval meter movement, is brought to bear on the surface of a sample while it is in the SEM.

Human Bloodstains on Biological Materials: High-Vacuum Scanning Electron Microscope Examination Using Specimens without Previous Preparation

2013 ◽  
Vol 19 (2) ◽  
pp. 415-419 ◽  
Author(s):  
Policarp Hortolà
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Secondary Electron ◽  
High Vacuum ◽  
Sample Treatment ◽  
Secondary Electron Mode ◽  
Electron Mode ◽  
Biological Substrates ◽  
Time Required ◽  
Scanning Electron

AbstractStudies of human bloodstains on nonbiological materials have been previously carried out using a high-vacuum scanning electron microscope (HV-SEM) in secondary-electron mode without any sample treatment. To assess whether biological substrates can affect the morphology of human erythrocytes in bloodstains, three fragments of different biological material (bone, shell, and wood) were smeared with peripheral human blood. Afterward, the bloodstains were directly examined in secondary-electron mode by an HV-SEM following a procedure initially standardized to be used in uncoated human bloodstains on stone. The obtained results suggest that HV-SEM is suitable for examining untreated bloodstains on biological substrate and that the morphology of erythrocytes in human bloodstains is not affected by the biological nature of the substrate. A cautionary issue regarding bloodstains on nondehydrated biological substrates is that the waiting time required for initiating the HV-SEM examination is by far higher than when using inorganic bloodstain substrates.

scholarly journals Потенциальные изображения сегнетоэлектрических доменных структур в кристаллах ниобата лития после формирования электронным лучом

2018 ◽  
Vol 60 (9) ◽  
pp. 1733
Author(s):  
Л.С. Коханчик
Keyword(s):  
Secondary Electron ◽  
Domain Walls ◽  
Low Voltage ◽  
Electric Polarization ◽  
Secondary Electrons ◽  
Domain Structures ◽  
Secondary Electron Mode ◽  
Electron Mode ◽  
Lithium Niobate Crystals ◽  
Reductive Annealing

AbstractFerroelectric domain structures formed by an electron beam in lithium niobate crystals are studied using low-voltage SEM microscopy. The structures are formed in crystals with different conductivity, including samples with high-resistance congruent composition (CLN) and samples with conductivity increased by reductive annealing (RLN). The potential nature of the contrast of the domain structures observed in the secondary electron mode depending on the conductivity of the samples and the direction of spontaneous polarization of the domains is analyzed. It is assumed that the domain contrast in CLN crystals is associated with long-lived charges localized near domain walls and in the irradiated areas. The recorded domain structures in the CLN crystals are visualized on polar and nonpolar cuts. In the RLN crystals with improved conductivity compared to CLN, the potential contrast of the periodic domain structures is found only on the polar cuts, where vector P _ s of the domains is perpendicular to the irradiated surface. This contrast is likely because the field of the spontaneous electric polarization charges influences the secondary electrons.

scholarly journals Scanning Helium Ion Microscopy-Induced Secondary Electron Yields of Composite Materials

2015 ◽  
Vol 21 (S3) ◽  
pp. 1691-1692
Author(s):  
Vighter Iberi ◽  
Uk Huh ◽  
Yueying Wu ◽  
Philip D. Rack ◽  
Adam J. Rondinone ◽  
...  
Keyword(s):  
Composite Materials ◽  
Secondary Electron ◽  
Helium Ion ◽  
Ion Microscopy

scholarly journals Imaging and Analytics on the Helium Ion Microscope

2019 ◽  
Vol 12 (1) ◽  
pp. 523-543 ◽  
Author(s):  
Tom Wirtz ◽  
Olivier De Castro ◽  
Jean-Nicolas Audinot ◽  
Patrick Philipp
Keyword(s):  
Mass Spectra ◽  
Secondary Electron ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Of Field ◽  
3D Images ◽  
Helium Ion ◽  
Scanning Transmission ◽  
Electron Imaging ◽  
Secondary Ion ◽  
High Depth

The helium ion microscope (HIM) has emerged as an instrument of choice for patterning, imaging and, more recently, analytics at the nanoscale. Here, we review secondary electron imaging on the HIM and the various methodologies and hardware components that have been developed to confer analytical capabilities to the HIM. Secondary electron–based imaging can be performed at resolutions down to 0.5 nm with high contrast, with high depth of field, and directly on insulating samples. Analytical methods include secondary electron hyperspectral imaging (SEHI), scanning transmission ion microscopy (STIM), backscattering spectrometry and, in particular, secondary ion mass spectrometry (SIMS). The SIMS system that was specifically designed for the HIM allows the detection of all elements, the differentiation between isotopes, and the detection of trace elements. It provides mass spectra, depth profiles, and 2D or 3D images with lateral resolutions down to 10 nm.

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