Measurement of defect thickness of the wall thinning defect pipes by lock-in infrared thermography technique

2009 ◽  
Author(s):  
Kyeongsuk Kim ◽  
Kyungsu Kim ◽  
Hyunchul Jung ◽  
Hosub Chang
Keyword(s):  
Infrared Thermography ◽  
Wall Thinning ◽  
Lock In

Detection of Wall-Thinning Defects in Nuclear Piping Components Using an Advanced Infrared Thermography Technique

2013 ◽  
Author(s):  
Jin Weon Kim ◽  
Kyung Won Yun ◽  
Hyun Chul Jung
Keyword(s):  
Thermal Conductivity ◽  
Infrared Thermography ◽  
High Thermal Conductivity ◽  
Detection Capability ◽  
Thermal Images ◽  
Wall Thinning ◽  
Phase Images ◽  
Lock In

An advanced infrared thermography (IRT) technique, known as lock-in mode IRT, has been developed and employed to improve the detection capability of defects in materials with high thermal conductivity. Lock-in mode IRT has been shown to provide better detection capability than conventional active IRT. Therefore, to investigate application of this technique to nuclear piping components, we conducted lock-in mode IRT tests on pipe specimens containing simulated wall-thinning defects. We obtained phase images of the wall-thinning defects and compared them with thermal images obtained from conventional active IRT tests. The results indicated that the ability to size the detected wall-thinning defects in piping components was improved by using lock-in mode IRT. The improvement was especially apparent when detecting short and narrow defects, and defects with slanted edges. However, the detection capability for shallow wall-thinning defects did not improve much when using lock-in mode IRT.

scholarly journals Infrared Thermography applied to power electron devices investigation

2015 ◽  
Vol 28 (2) ◽  
pp. 205-212 ◽  
Author(s):  
Giovanni Breglio ◽  
Andrea Irace ◽  
Luca Maresca ◽  
Michele Riccio ◽  
Gianpaolo Romano ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Infrared Thermography ◽  
Semiconductor Devices ◽  
Electronic Devices ◽  
Experimental Characterization ◽  
Ir Thermography ◽  
Power Semiconductor ◽  
Power Semiconductor Devices ◽  
Electron Devices ◽  
Lock In

The aim of this paper is to give a presentation of the principal applications of Infrared Thermography for analysis and testing of electrondevices. Even though experimental characterization could be carried out on almost any electronic devices and circuits, here IR Thermography for investigation of power semiconductor devices is presented. Different examples of functional and failure analysis in both transient and lock-in modes will be reported.

scholarly journals Porosity and Inclusion Detection in CFRP by Infrared Thermography

2012 ◽  
Vol 2012 ◽  
pp. 1-6 ◽  
Author(s):  
C. Toscano ◽  
C. Meola ◽  
M. C. Iorio ◽  
G. M. Carlomagno
Keyword(s):  
Infrared Thermography ◽  
Production Costs ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Evaluation Methodologies ◽  
Slag Inclusions ◽  
Aeronautical Industry ◽  
Testing Techniques ◽  
Lock In ◽  
Non Destructive

The ever wide use of composite materials in the aeronautical industry has evidenced the need for development of ever more effective nondestructive evaluation methodologies in order to reduce rejected parts and to optimize production costs. Infrared thermography has been recently enclosed amongst the standardized non destructive testing techniques, but its usefulness needs still complete assessment since it can be employed in several different arrangements and for many purposes. In this work, the possibility to detect slag inclusions and porosity is analyzed with both lock-in themography and pulse thermography in the transmission mode. To this end, carbon-fiber-peinforced polymers different specimens are specifically fabricated of several different stacking sequences and with embedded slag inclusions and porosity percentages. As main results, both of the techniques are found definitely able to reveal the presence of the defects above mentioned. Moreover, these techniques could be considered complementary in order to better characterize the nature of the detected defects.

scholarly journals Suitability of lock-in infrared thermography for luminescent glass development

2019 ◽  
Vol 17 (2) ◽  
pp. 96-106
Author(s):  
Peter W. Nolte ◽  
Nils Ziegeler ◽  
A. Charlotte Rimbach ◽  
Stefan Schweizer
Keyword(s):  
Infrared Thermography ◽  
Lock In
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