Electronic noise comparison of amorphous silicon current mode and voltage mode active pixel sensors for large area digital x-ray imaging

2010 ◽  
Author(s):  
Dali Wu ◽  
Nader Safavian ◽  
Mohammad Y. Yazdandoost ◽  
Mohammad Hadi Izadi ◽  
Karim S. Karim
1997 ◽  
Vol 44 (10) ◽  
pp. 1747-1758 ◽  
Author(s):  
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B. Pain ◽  
T. Nomoto ◽  
T. Nakamura ◽  
E.R. Fossum

2003 ◽  
Author(s):  
Peter Holl ◽  
Peter Fischer ◽  
Robert Hartmann ◽  
Gunther Hasinger ◽  
Johannes Kollmer ◽  
...  

2018 ◽  
Vol 13 (02) ◽  
pp. C02023-C02023
Author(s):  
M.S. Kim ◽  
Y. Kim ◽  
G. Kim ◽  
K.T. Lim ◽  
G. Cho ◽  
...  

2009 ◽  
Author(s):  
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David M. Hunter ◽  
Karim S. Karim ◽  
George Belev ◽  
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...  

2014 ◽  
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S. Aschauer ◽  
A. Bähr ◽  
G. Lutz ◽  
P. Majewski ◽  
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Glenn H. Chapman ◽  
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1997 ◽  
Vol 487 ◽  
Author(s):  
S. Ross ◽  
G. Zentai

AbstractThis paper presents results from our on-going efforts to characterize semiconductor thin films for direct x-ray conversion. We deposit these thin films onto an amorphous silicon (a-Si:H) readout array with the overall goal of developing a large area x-ray detector for protein crystallography, and for other x-ray imaging fields.


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