Wide-autoscanned narrow-line tunable system based on CW Ti:Sapphire/dye laser for high-precision experiments in nanophysics

2009 ◽  
Author(s):  
Sergey Kobtsev ◽  
Vladimir Baraulya ◽  
Vladimir Lunin
Keyword(s):  
High Precision ◽  
Dye Laser ◽  
Narrow Line ◽  
Tunable System

Effect of pump beam resonator on the performance of narrow line-width Rhodamine 110 dye laser

2013 ◽  
Vol 45 ◽  
pp. 373-378
Author(s):  
J. Kumar ◽  
R. Mahakud ◽  
O. Prakash ◽  
S.K. Dixit
Keyword(s):  
Line Width ◽  
Pump Beam ◽  
Dye Laser ◽  
Narrow Line ◽  
Beam Resonator ◽  
Narrow Line Width

Developing a narrow-line laser spectrometer based on a tunable continuous-wave dye laser

2014 ◽  
Vol 85 (8) ◽  
pp. 083113
Author(s):  
Chun Wang ◽  
Shasha Lv ◽  
Fang Liu ◽  
Jin Bi ◽  
Liufeng Li ◽  
...  
Keyword(s):  
Continuous Wave ◽  
Dye Laser ◽  
Narrow Line ◽  
Laser Spectrometer

Studies on 20 kHz pulse repetition rate class narrow line-width dye laser

Optik ◽  
2013 ◽  
Vol 124 (13) ◽  
pp. 1595-1600 ◽  
Author(s):  
G.K. Mishra ◽  
R. Biswal ◽  
Sachin Agrawal ◽  
Om Prakash ◽  
S.K. Dixit
Keyword(s):  
Line Width ◽  
Repetition Rate ◽  
Pulse Repetition Rate ◽  
Dye Laser ◽  
Pulse Repetition ◽  
Narrow Line ◽  
Narrow Line Width ◽  
Rate Class

A Computer-Controlled Two-Dye-Laser Heterodyne Spectrometer of High Precision

1985 ◽  
pp. 375-376
Author(s):  
S. Grafström ◽  
U. Harbarth ◽  
J. Kowalski ◽  
R. Neumann ◽  
S. Noehte ◽  
...  
Keyword(s):  
High Precision ◽  
Dye Laser ◽  
Laser Heterodyne ◽  
Computer Controlled ◽  
Heterodyne Spectrometer

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

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