scholarly journals Mirror And Grating Surface Figure Requirements For Grazing Incidence Synchrotron Radiation Beamlines: Power Loading Effects

1988 ◽  
Vol 27 (6) ◽  
Author(s):  
Steven L. Hulbert ◽  
Sushil Sharma
Keyword(s):  
Synchrotron Radiation ◽  
Grazing Incidence ◽  
Power Loading ◽  
Loading Effects ◽  
Surface Figure

Grazing-incidence antireflection films. IV. Application to Mössbauer filtering of synchrotron radiation

1985 ◽  
Vol 32 (10) ◽  
pp. 6374-6384 ◽  
Author(s):  
J. P. Hannon ◽  
G. T. Trammell ◽  
M. Mueller ◽  
E. Gerdau ◽  
R. Rüffer ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Grazing Incidence

EPITAXY OF ULTRATHIN CoO FILMS STUDIED BY XPD AND GIXRD

2002 ◽  
Vol 09 (02) ◽  
pp. 937-941 ◽  
Author(s):  
P. LUCHES ◽  
C. GIOVANARDI ◽  
T. MOIA ◽  
S. VALERI ◽  
F. BRUNO ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Lattice Constant ◽  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Direction Parallel ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Rocksalt Structure ◽  
Plane Lattice

CoO layers have been grown by exposing to oxygen the (001) body-centered-tetragonal (bct) surface of a Co ultrathin film epitaxially grown on Fe(001). Different oxide thicknesses in the 2–15 ML range have been investigated by means of synchrotron-radiation-based techniques. X-ray photoelectron spectroscopy has been used to check the formation of the oxide films; X ray photoelectron diffraction has given information concerning the symmetry of their unit cell; grazing incidence X-ray diffraction has allowed to evaluate precisely their in-plane lattice constant. The films show a CoO(001) rocksalt structure, rotated by 45° with respect to the bct Co substrate, with the [100] direction parallel to the substrate [110] direction. Their in-plane lattice constant increases as a function of thickness, to release the in-plane strain due to the 3% mismatch between the bulk CoO phase and the underlying substrate.

Grazing Incidence X-Ray Fluorescence Analysis using Synchrotron Radiation

1991 ◽  
Vol 35 (B) ◽  
pp. 795-806
Author(s):  
Atsuo Iida
Keyword(s):  
Synchrotron Radiation ◽  
Elemental Concentration ◽  
Depth Distribution ◽  
Fluorescence Analysis ◽  
Grazing Incidence ◽  
Material Surface ◽  
Fluorescence Signal ◽  
Elemental Distribution ◽  
X Ray ◽  
Glancing Angle

AbstractThe X-ray fluorescence analysis of a trace element under a grazing incidence condition has been developed using synchrotron radiation. The interference effect plays an important role for determining the depth distribution of the elemental concentration. The elemental distribution above, on or below the material surface has been studied. The glancing angle dependence of the X-ray fluorescence signal around the critical angle strongly reflects the elemental distribution, and can be used to determine the position of the element of interest.

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