X-Ray Imaging Characteristics Of The Vacuum-Demountable Microchannel Spatial Light Modulator

1986 ◽  
Vol 25 (2) ◽  
pp. 252269 ◽  
Author(s):  
Robert F. Dillon ◽  
Cardinal Warde
Keyword(s):  
Spatial Light Modulator ◽  
Light Modulator ◽  
X Ray ◽  
Imaging Characteristics ◽  
X Ray Imaging

X-ray imaging characteristics from a large spherically bent mica crystal (abstract)

2001 ◽  
Vol 72 (1) ◽  
pp. 1248-1248 ◽  
Author(s):  
S. G. Lee ◽  
J. G. Bak ◽  
H. G. Lee ◽  
M. Kwon ◽  
M. Bitter ◽  
...  
Keyword(s):  
X Ray ◽  
Imaging Characteristics ◽  
X Ray Imaging ◽  
Mica Crystal

Imaging characteristics of the development model of the SAX x-ray imaging concentrators

1991 ◽  
Author(s):  
Oberto Citterio ◽  
Paolo Conconi ◽  
Giancarlo Conti ◽  
E. Mattaini ◽  
E. Santambrogio ◽  
...  
Keyword(s):  
Development Model ◽  
X Ray ◽  
Imaging Characteristics ◽  
X Ray Imaging

Scanning Tunneling Optical Resonance Microscopy (STORM)

2002 ◽  
Vol 738 ◽  
Author(s):  
R.P. Raffaelle ◽  
T. Gennett ◽  
J. E. Lau ◽  
P. Jenkins ◽  
S.L. Castro ◽  
...  
Keyword(s):  
Spatial Light Modulator ◽  
Tunneling Current ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Light Modulator ◽  
Optical Resonance ◽  
X Ray ◽  
Lock In ◽  
Good Agreement

ABSTRACTThe ability to determine the in-situ optoelectronic behavior of semiconductor materials has become especially important as the size of device architectures is reduced and the development of complex microsystems has increased. Scanning Tunneling Optical Resonance Microscopy or STORM has the ability to interrogate the optical bandgap as a function of position within a semiconductor microstructure. This technique uses a tunable solid-state Ti sapphire laser whose output is “chopped” using a spatial light modulator and is coupled by a fiber optic to a scanning tunneling microscope in order to illuminate the tip-sample junction. The photoenhanced portion of the tunneling current is spectroscopically measured using a lock-in technique. The capabilities of this technique were verified using semiconductor microstructure calibration standards that were grown by organometallic vapor phase epitaxy (OMVPE) at the NASA Glenn Research Center. Bandgaps characterized by STORM measurements were found to be in good agreement with the bulk values determined by transmission spectroscopy, photoluminescence, and with the theoretical values that were based on x-ray diffraction results.

X-ray imaging characteristics of a direct conversion detector using selenium and thin film transistor array

1997 ◽  
Author(s):  
Brian Rodricks ◽  
Denny L. Lee ◽  
Lawrence K. Cheung ◽  
Lothar S. Jeromin ◽  
Eugene F. Palecki
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Direct Conversion ◽  
X Ray ◽  
Imaging Characteristics ◽  
X Ray Imaging

scholarly journals Analysis of the Imaging Characteristics of the KB and KBA X-ray Microscopes at Non-coaxial Grazing Incidence

Open Physics ◽  
2018 ◽  
Vol 16 (1) ◽  
pp. 751-756
Author(s):  
Zhao Lingling ◽  
Jon Knepper
Keyword(s):  
Grazing Incidence ◽  
Coded Aperture ◽  
Imaging Method ◽  
X Rays ◽  
Space Technology ◽  
Focal Distance ◽  
X Ray ◽  
Process Diagnosis ◽  
Imaging Characteristics ◽  
X Ray Imaging

AbstractIn the last 20 years, requirements for x-ray lithography, space technology and ICF process diagnosis, the x-ray imaging technology has been developed. However, x-ray imaging turns out to be more difficult due to intense absorption of x-rays, and the refractive index of x band is slightly less than 1. Normal imaging method may not be suitable for x-ray band. At present, grazing reflective imaging and coded aperture imaging are commonly used for this band. This paper presents a detailed analysis of the imaging characteristics of single-mirror and double-mirror. Then the focal distance, field obliquity and aperture position of the mirrors of the KBA microscopes at grazing incidence are studied. The results show that the structure arrangement of the KBA microscope is rather reasonable, and can be considered as theoretical evidence in the design and manufacture of KBA microscopes.

Engineering qualification model of the SAX x-ray mirror unit: technical data and x-ray imaging characteristics

1994 ◽  
Author(s):  
Giancarlo Conti ◽  
E. Mattaini ◽  
E. Santambrogio ◽  
Bruno Sacco ◽  
Giancarlo Cusumano ◽  
...  
Keyword(s):  
Technical Data ◽  
X Ray ◽  
Imaging Characteristics ◽  
X Ray Imaging

Defects of Platelet Function Recognized by X-Ray Imaging and Scanning Electron Microscopy

1985 ◽  
Vol 43 ◽  
pp. 610-613
Author(s):  
M.G. Baldini ◽  
S. Morinaga ◽  
D. Minasian ◽  
R. Feder ◽  
D. Sayre ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cell Biology ◽  
Imaging Technique ◽  
Human Platelets ◽  
X Rays ◽  
X Ray ◽  
X Ray Imaging ◽  
Complex Phenomena ◽  
Scanning Electron

Contact X-ray imaging is presently developing as an important imaging technique in cell biology. Our recent studies on human platelets have demonstrated that the cytoskeleton of these cells contains photondense structures which can preferentially be imaged by soft X-ray imaging. Our present research has dealt with platelet activation, i.e., the complex phenomena which precede platelet appregation and are associated with profound changes in platelet cytoskeleton. Human platelets suspended in plasma were used. Whole cell mounts were fixed and dehydrated, then exposed to a stationary source of soft X-rays as previously described. Developed replicas and respective grids were studied by scanning electron microscopy (SEM).

Designing high-resolution slow scan CCD-based TEM camera systems

1992 ◽  
Vol 50 (2) ◽  
pp. 946-947
Author(s):  
James F. Mancuso ◽  
William B. Maxwell ◽  
Russell E. Camp ◽  
Mark H. Ellisman
Keyword(s):  
Fiber Optics ◽  
Ccd Camera ◽  
High Energy ◽  
Phosphor Layer ◽  
X Ray ◽  
Light Production ◽  
Camera Systems ◽  
X Ray Imaging ◽  
Electron Image ◽  
Scintillating Fiber

The imaging requirements for 1000 line CCD camera systems include resolution, sensitivity, and field of view. In electronic camera systems these characteristics are determined primarily by the performance of the electro-optic interface. This component converts the electron image into a light image which is ultimately received by a camera sensor.Light production in the interface occurs when high energy electrons strike a phosphor or scintillator. Resolution is limited by electron scattering and absorption. For a constant resolution, more energy deposition occurs in denser phosphors (Figure 1). In this respect, high density x-ray phosphors such as Gd2O2S are better than ZnS based cathode ray tube phosphors. Scintillating fiber optics can be used instead of a discrete phosphor layer. The resolution of scintillating fiber optics that are used in x-ray imaging exceed 20 1p/mm and can be made very large. An example of a digital TEM image using a scintillating fiber optic plate is shown in Figure 2.

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