Aspherical Surface Testing With Shearing Interferometer Using Fringe Scanning Detection Method

1984 ◽  
Vol 23 (4) ◽  
Author(s):  
Toyohiko Yatagai ◽  
Toshio Kanou
Keyword(s):  
Detection Method ◽  
Aspherical Surface ◽  
Scanning Detection ◽  
Surface Testing

Concave Aspherical Surface Testing with Twin Computer-Generated Holograms

2008 ◽  
Vol 28 (7) ◽  
pp. 1313-1317
Author(s):  
谢意 Xie Yi ◽  
陈强 Chen Qiang ◽  
伍凡 Wu Fan ◽  
侯溪 Hou Xi ◽  
张晶 Zhang Jing ◽  
...  
Keyword(s):  
Aspherical Surface ◽  
Computer Generated Holograms ◽  
Surface Testing

scholarly journals Large-Aperture Real-Time Compensated Collimating Wavefront Error Detection Method

2019 ◽  
Vol 9 (11) ◽  
pp. 2370
Author(s):  
Xueliang Zhu ◽  
Dasen Wang ◽  
Fengming Nie ◽  
Bingcai Liu ◽  
Hongjun Wang ◽  
...  
Keyword(s):  
Real Time ◽  
Error Detection ◽  
Detection Method ◽  
Three Dimensional ◽  
Surface Measurement ◽  
Dimensional Error ◽  
Detection Technology ◽  
Wavefront Error ◽  
Scanning Detection ◽  
Wavefront Detection

This paper proposes a real-time compensated pentaprism scanning wavefront detection method to achieve real-time compensation for scanning errors occurring during prism movement along a guide rail. The method is based on existing pentaprism scanning wavefront detection technology and it is realized by applying self-collimation-based three-dimensional error compensation. Using theoretical and data analyses of a detection experiment, the reliability of the optimized pentaprism scanning detection method is verified, thus effectively ensuring the reasonable estimation of the interferometry surface measurement uncertainty.

Computer-Generated Hologram Design for High-Precision Aspherical Surface Testing

2016 ◽  
Vol 53 (9) ◽  
pp. 090901
Author(s):  
高松涛 Gao Songtao ◽  
武东城 Wu Dongcheng ◽  
于长淞 Yu Changsong
Keyword(s):  
High Precision ◽  
Aspherical Surface ◽  
Computer Generated Hologram ◽  
Surface Testing

scholarly journals Convex Aspherical Surface Testing Using Catadioptric Partial Compensating System

2016 ◽  
Vol 680 ◽  
pp. 012036
Author(s):  
Jingxian Wang ◽  
Qun Hao ◽  
Yao Hu ◽  
Shaopu Wang ◽  
Tengfei Li ◽  
...  
Keyword(s):  
Aspherical Surface ◽  
Surface Testing

Aspherical surface testing by using spherical compensation

1999 ◽  
Author(s):  
Johannes Pfund ◽  
Norbert Lindlein ◽  
Johannes Schwider
Keyword(s):  
Aspherical Surface ◽  
Surface Testing

Solid-phase immunoelectron microscopy for rapid diagnosis of enteroviruses

1984 ◽  
Vol 42 ◽  
pp. 226-227 ◽  
Author(s):  
K. Pegg-Feige ◽  
F. W. Doane
Keyword(s):  
Electron Microscopy ◽  
Cell Culture ◽  
Immunoelectron Microscopy ◽  
Detection Method ◽  
Solid Phase ◽  
Protein A ◽  
Plant Viruses ◽  
Rapid Diagnosis ◽  
Virus Diagnosis ◽  
Antiviral Antibody

Immunoelectron microscopy (IEM) applied to rapid virus diagnosis offers a more sensitive detection method than direct electron microscopy (DEM), and can also be used to serotype viruses. One of several IEM techniques is that introduced by Derrick in 1972, in which antiviral antibody is attached to the support film of an EM specimen grid. Originally developed for plant viruses, it has recently been applied to several animal viruses, especially rotaviruses. We have investigated the use of this solid phase IEM technique (SPIEM) in detecting and identifying enteroviruses (in the form of crude cell culture isolates), and have compared it with a modified “SPIEM-SPA” method in which grids are coated with protein A from Staphylococcus aureus prior to exposure to antiserum.

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