Light extraction from OLEDS with (high) index matched glass substrates

Author(s):  
Georg Gaertner ◽  
Horst Greiner
Author(s):  
Wooram Youn ◽  
Jinhyung Lee ◽  
Minfei Xu ◽  
Chaoyu Xiang ◽  
Rajiv Singh ◽  
...  
Keyword(s):  

2009 ◽  
Vol 95 (2) ◽  
pp. 021101 ◽  
Author(s):  
A. Drezet ◽  
F. Przybilla ◽  
E. Laux ◽  
O. Mahboub ◽  
C. Genet ◽  
...  

2011 ◽  
Vol 19 (S4) ◽  
pp. A701 ◽  
Author(s):  
Xing Sheng ◽  
Lirong Zeng Broderick ◽  
Juejun Hu ◽  
Li Yang ◽  
Anat Eshed ◽  
...  

2014 ◽  
Vol 29 (30) ◽  
pp. 1430070 ◽  
Author(s):  
Arno Knapitsch ◽  
Paul Lecoq

The amount of light and its time distribution are key factors determining the performance of scintillators when used as radiation detectors. However most inorganic scintillators are made of heavy materials and suffer from a high index of refraction which limits light extraction efficiency. This increases the path length of the photons in the material with the consequence of higher absorption and tails in the time distribution of the extracted light. Photonic crystals are a relatively new way of conquering this light extraction problem. Basically they are a way to produce a smooth and controllable index matching between the scintillator and the output medium through the nanostructuration of a thin layer of optically transparent high index material deposited at the coupling face of the scintillator. Our review paper discusses the theory behind this approach as well as the simulation details. Furthermore the different lithography steps of the production of an actual photonic crystal sample will be explained. Measurement results of LSO scintillator pixels covered with a nanolithography machined photonic crystal surface are presented together with practical tips for the further development and improvement of this technique.


2012 ◽  
Vol 12 (4) ◽  
pp. 3447-3450 ◽  
Author(s):  
Doo-Hee Cho ◽  
Jin-Wook Shin ◽  
Jeong-Ik Lee ◽  
Jonghee Lee ◽  
Jun-Han Han ◽  
...  

Author(s):  
C. M. Sung ◽  
D. B. Williams

Researchers have tended to use high symmetry zone axes (e.g. <111> <114>) for High Order Laue Zone (HOLZ) line analysis since Jones et al reported the origin of HOLZ lines and described some of their applications. But it is not always easy to find HOLZ lines from a specific high symmetry zone axis during microscope operation, especially from second phases on a scale of tens of nanometers. Therefore it would be very convenient if we can use HOLZ lines from low symmetry zone axes and simulate these patterns in order to measure lattice parameter changes through HOLZ line shifts. HOLZ patterns of high index low symmetry zone axes are shown in Fig. 1, which were obtained from pure Al at -186°C using a double tilt cooling holder. Their corresponding simulated HOLZ line patterns are shown along with ten other low symmetry orientations in Fig. 2. The simulations were based upon kinematical diffraction conditions.


2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.


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