scholarly journals Thermally stable multi-mode polymer optical waveguide fabricated by single-step photo-patterning of fluorinated polyimide/epoxy hybrids

Author(s):  
Yuichi Urano ◽  
Ningjuan Chen ◽  
Kaichiro Nakano ◽  
Katsumi Maeda ◽  
Shinji Ando
2019 ◽  
Author(s):  
Nathan O'Brien ◽  
Polla Rouf ◽  
Rouzbeh Samii ◽  
Karl Rönnby ◽  
Sydney C. Buttera ◽  
...  

Indium nitride (InN) is characterised by its superb electron mobility making it a ground-breaking material for high frequency electronics. The difficulty of depositing highquality crystalline InN currently impedes its broad implementation in electronic devices. Herein, we report a new highly volatile and thermally stable In(III) triazenide precursor and demonstrate its ability to deposit high-quality epitaxial hexagonal InN by atomic layer deposition (ALD). The new triazenide precursor was found to sublime at 80 °C and thermogravimetric analysis showed single step volatilisation with an onset temperature of 145 °C and negligible residual mass. Strikingly, two temperature intervals were observed when depositing InN films. In the high temperature interval, the precursor underwent thermal decomposition inside the ALD reaction chamber to produce a more reactive indium compound whilst retaining self-limiting growth behaviour. Stochiometric InN films with very low levels of impurities were grown epitaxially on 4H-SiC. This new triazenide precursor now enables ALD of InN for semi-conductor applications.<br>


2002 ◽  
Vol 14 (9) ◽  
pp. 1297-1299 ◽  
Author(s):  
Jae-Wook Kang ◽  
Jang-Joo Kim ◽  
Jinkyu Kim ◽  
Xiangdan Li ◽  
Myong-Hoon Lee

1999 ◽  
Vol 341 (1-2) ◽  
pp. 192-195 ◽  
Author(s):  
J.H. Kim ◽  
E.J. Kim ◽  
H.C. Choi ◽  
C.W. Kim ◽  
J.H. Cho ◽  
...  

2019 ◽  
Author(s):  
Nathan O'Brien ◽  
Polla Rouf ◽  
Rouzbeh Samii ◽  
Karl Rönnby ◽  
Sydney C. Buttera ◽  
...  

Indium nitride (InN) is characterised by its superb electron mobility making it a ground-breaking material for high frequency electronics. The difficulty of depositing highquality crystalline InN currently impedes its broad implementation in electronic devices. Herein, we report a new highly volatile and thermally stable In(III) triazenide precursor and demonstrate its ability to deposit high-quality epitaxial hexagonal InN by atomic layer deposition (ALD). The new triazenide precursor was found to sublime at 80 °C and thermogravimetric analysis showed single step volatilisation with an onset temperature of 145 °C and negligible residual mass. Strikingly, two temperature intervals were observed when depositing InN films. In the high temperature interval, the precursor underwent thermal decomposition inside the ALD reaction chamber to produce a more reactive indium compound whilst retaining self-limiting growth behaviour. Stochiometric InN films with very low levels of impurities were grown epitaxially on 4H-SiC. This new triazenide precursor now enables ALD of InN for semi-conductor applications.<br>


Author(s):  
Mitsuo Usui ◽  
Shigeki Ishibashi ◽  
Hirooki Hirata ◽  
Suzuko Ishizawa ◽  
Nobutatsu Koshoubu ◽  
...  

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