Evaluation of fiber coupling coefficient by a deformed cell in dual-beam optical stretcher

2007 ◽  
Author(s):  
Paul Brule-Bareil ◽  
Yunlong Sheng
Keyword(s):  
Coupling Coefficient ◽  
Fiber Coupling ◽  
Dual Beam ◽  
Optical Stretcher

MODELING OF INDUCED VOLTAGE OF SILICON DIOXIDE FIBER COUPLING

2009 ◽  
Vol 18 (03) ◽  
pp. 481-488 ◽  
Author(s):  
NOR FARIDAH HANIM ◽  
SAKTIOTO ◽  
JALIL ALI ◽  
ROSLY ABDUL RAHMAN
Keyword(s):  
Refractive Index ◽  
Silicon Dioxide ◽  
Breakdown Voltage ◽  
Coupling Coefficient ◽  
Empirical Equation ◽  
Induced Voltage ◽  
New Model ◽  
Fiber Coupling ◽  
Fiber Coupler

This paper describes a new model for the breakdown voltage of SiO 2 fiber coupler using the Pockel effect and empirical equation. The model is evaluated by using the coupling coefficient and the changes in the refractive index. We found that the breakdown voltage is in the order of 102 volt corresponding to coupling coefficient by the order of mm-1. Increasing the value of coupling coefficient between the electrodes leads to a reduction in the breakdown voltage.

scholarly journals Non-contact trapping and stretching of biological cells using dual-beam optical stretcher on microfluidic platform

2019 ◽  
Author(s):  
Aotuo Dong ◽  
Balaadithya Uppalapati ◽  
Md. Shariful Islam ◽  
Brandon Gibbs ◽  
Ganesan Kamatchi ◽  
...  
Keyword(s):  
Biological Cells ◽  
Microfluidic Platform ◽  
Dual Beam ◽  
Optical Stretcher

scholarly journals Calculation of spherical red blood cell deformation in a dual-beam optical stretcher

2007 ◽  
Vol 15 (24) ◽  
pp. 16029 ◽  
Author(s):  
Paul B. Bareil ◽  
Yunlong Sheng ◽  
Yin-Quan Chen ◽  
Arthur Chiou
Keyword(s):  
Blood Cell ◽  
Red Blood Cell ◽  
Cell Deformation ◽  
Dual Beam ◽  
Optical Stretcher

Development of single mode fiber coupling coefficient using kinetic model

Optik ◽  
2010 ◽  
Vol 121 (24) ◽  
pp. 2240-2244
Author(s):  
T. Phattaraworamet ◽  
T. Saktioto ◽  
J. Ali ◽  
M. Fadhali ◽  
P.P. Yupapin ◽  
...  
Keyword(s):  
Kinetic Model ◽  
Coupling Coefficient ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Fiber Coupling

Scaling Law of Coupling Coefficient and Coil Size in Wireless Power Transfer Design via Magnetic Coupling

2017 ◽  
Vol 137 (4) ◽  
pp. 326-333
Author(s):  
Chiaki Nagai ◽  
Kenji Inukai ◽  
Masato Kobayashi ◽  
Tatsuya Tanaka ◽  
Kensho Abumi ◽  
...  
Keyword(s):  
Coupling Coefficient ◽  
Scaling Law ◽  
Magnetic Coupling ◽  
Wireless Power Transfer ◽  
Power Transfer ◽  
Wireless Power ◽  
Coil Size

The Determination of the Magnetoelectric Coupling Coefficient in Ferroelectric–Ferromagnetic Composite Based on PZT–Ferrite

2013 ◽  
Vol 58 (4) ◽  
pp. 1401-1403 ◽  
Author(s):  
J.A. Bartkowska ◽  
R. Zachariasz ◽  
D. Bochenek ◽  
J. Ilczuk
Keyword(s):  
Dielectric Permittivity ◽  
Coupling Coefficient ◽  
Mean Field ◽  
Field Approximation ◽  
Theoretical Description ◽  
Magnetoelectric Coupling ◽  
Mean Field Approximation ◽  
Dielectric Measurements ◽  
Temperature Dependences ◽  
Multiferroic Composite

Abstract In the present work, the magnetoelectric coupling coefficient, from the temperature dependences of the dielectric permittivity for the multiferroic composite was determined. The research material was ferroelectric-ferromagnetic composite on the based PZT and ferrite. We investigated the temperature dependences of the dielectric permittivity (") for the different frequency of measurement’s field. From the dielectric measurements we determined the temperature of phase transition from ferroelectric to paraelectric phase. For the theoretical description of the temperature dependence of the dielectric constant, the Hamiltonian of Alcantara, Gehring and Janssen was used. To investigate the dielectric properties of the multiferroic composite this Hamiltonian was expressed under the mean-field approximation. Based on dielectric measurements and theoretical considerations, the values of the magnetoelectric coupling coefficient were specified.

3D Investigations of Plasma Erosion Craters using FIB/SEM Dual-Beam Techniques

2006 ◽  
Vol 43 (9) ◽  
pp. 470-482 ◽  
Author(s):  
Nicolas Jeanvoine ◽  
Christian Holzapfel ◽  
Flavio Soldera ◽  
Frank Mücklich
Keyword(s):  
Dual Beam ◽  
Plasma Erosion

Application of Automated FIB for TEM Sample Preparation in Semiconductor Failure Analysis

2014 ◽  
Author(s):  
Jie Zhu ◽  
Soo Sien Seah ◽  
Irene Tee ◽  
Bing Hai Liu ◽  
Eddie Er ◽  
...  
Keyword(s):  
Sample Preparation ◽  
Success Rate ◽  
Protective Layer ◽  
Factors Affecting ◽  
Dual Beam ◽  
Lamella Thickness ◽  
Surface Patterns ◽  
Working Parameters ◽  
Practical Factors ◽  
High Flexibility

Abstract In this paper, we describe automated FIB for TEM sample preparation using iFast software on a Helios 450HP dual-beam system. A robust iFast automation recipe needs to consider as many variables as possible in order to ensure consistent sample quality and high success rate. Variations mainly come from samples of different materials, structures, surface patterns, surface topography and surface charging. The recipe also needs to be user-friendly and provide high flexibility by allowing users to choose preferable working parameters for specific types of samples, such as: grounding, protective layer coating, milling steps, and final TEM lamella thickness/width. In addition to the iFast recipe, other practical factors affecting automation success rate are also discussed and highlighted.

To Eliminate Curtain Effect of FIB TEM Samples by a Combination of Sample Dicing and Backside Milling

2014 ◽  
Author(s):  
Jian-Shing Luo ◽  
Hsiu Ting Lee
Keyword(s):  
Sample Preparation ◽  
Focused Ion Beam ◽  
Preparation Method ◽  
Low Cost ◽  
Ion Beam ◽  
Sample Preparation Method ◽  
Site Specific ◽  
Dual Beam ◽  
Transmission Electron

Abstract Several methods are used to invert samples 180 deg in a dual beam focused ion beam (FIB) system for backside milling by a specific in-situ lift out system or stages. However, most of those methods occupied too much time on FIB systems or requires a specific in-situ lift out system. This paper provides a novel transmission electron microscopy (TEM) sample preparation method to eliminate the curtain effect completely by a combination of backside milling and sample dicing with low cost and less FIB time. The procedures of the TEM pre-thinned sample preparation method using a combination of sample dicing and backside milling are described step by step. From the analysis results, the method has applied successfully to eliminate the curtain effect of dual beam FIB TEM samples for both random and site specific addresses.

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