Dual-wavelength vertical scanning low-coherence interference microscopy

2007 ◽  
Author(s):  
Jan Niehues ◽  
Peter Lehmann
Keyword(s):  
Dual Wavelength ◽  
Interference Microscopy ◽  
Low Coherence

scholarly journals Signal modeling in low coherence interference microscopy on example of rectangular grating

2016 ◽  
Vol 24 (13) ◽  
pp. 14283 ◽  
Author(s):  
Weichang Xie ◽  
Peter Lehmann ◽  
Jan Niehues ◽  
Stanislav Tereschenko
Keyword(s):  
Interference Microscopy ◽  
Signal Modeling ◽  
Low Coherence

Transparent layer thickness measurement using low-coherence interference microscopy

2015 ◽  
Author(s):  
P. Kühnhold ◽  
A. Nolvi ◽  
S. Tereschenko ◽  
I. Kassamakov ◽  
E. Hæggström ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Thickness Measurement ◽  
Interference Microscopy ◽  
Low Coherence ◽  
Transparent Layer

Dual-wavelength low-coherence instantaneous phase-shifting interferometer to measure the shape of a segmented mirror with subnanometer precision

2008 ◽  
Vol 47 (29) ◽  
pp. 5473 ◽  
Author(s):  
Rainer Wilhelm ◽  
Bruno Luong ◽  
Alain Courteville ◽  
Sébastien Estival ◽  
Frédéric Gonté ◽  
...  
Keyword(s):  
Phase Shifting ◽  
Dual Wavelength ◽  
Low Coherence ◽  
Instantaneous Phase ◽  
Segmented Mirror

Contrast modification for ultra-high resolution low-coherence interference microscopy by Fourier-plane filtering

2011 ◽  
Author(s):  
Stefan E. Schausberger ◽  
Bettina Heise ◽  
Christian Maurer ◽  
Stefan Bernet ◽  
Monika Ritsch-Marte ◽  
...  
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Fourier Plane ◽  
Low Coherence
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