Transparent layer thickness measurement using low-coherence interference microscopy

2015 ◽  
Author(s):  
P. Kühnhold ◽  
A. Nolvi ◽  
S. Tereschenko ◽  
I. Kassamakov ◽  
E. Hæggström ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Thickness Measurement ◽  
Interference Microscopy ◽  
Low Coherence ◽  
Transparent Layer

scholarly journals Interferometric Instrument for Thickness Measurement on Blown Films

Photonics ◽  
2021 ◽  
Vol 8 (7) ◽  
pp. 245
Author(s):  
Michele Norgia ◽  
Alessandro Pesatori
Keyword(s):  
Film Thickness ◽  
Temperature Compensation ◽  
Close Contact ◽  
Thickness Measurement ◽  
The Novel ◽  
Blown Films ◽  
Low Coherence ◽  
Real Time Measurement ◽  
Blown Film ◽  
Standard Techniques

Real-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, while their contact can damage the film. Different optical contactless techniques are described in literature, but none has found application to real production, due to the strong vibration of the films. We propose a new structure of low-coherence fiber interferometer able to measure blown film thickness during productions. The novel fiber-optic setup is a cross between an autocorrelator and a white light interferometer, taking the advantages of both approaches.

Macular ganglion cell-Inner plexiform layer thickness measurement and reproducibility with SD-OCT

2012 ◽  
Vol 90 ◽  
pp. 0-0
Author(s):  
M FRANCOZ ◽  
J FENOLLAND ◽  
JM GIRAUD ◽  
H EL CHEHAB ◽  
D SENDON ◽  
...  
Keyword(s):  
Ganglion Cell ◽  
Layer Thickness ◽  
Plexiform Layer ◽  
Thickness Measurement ◽  
Inner Plexiform Layer ◽  
Sd Oct

scholarly journals Signal modeling in low coherence interference microscopy on example of rectangular grating

2016 ◽  
Vol 24 (13) ◽  
pp. 14283 ◽  
Author(s):  
Weichang Xie ◽  
Peter Lehmann ◽  
Jan Niehues ◽  
Stanislav Tereschenko
Keyword(s):  
Interference Microscopy ◽  
Signal Modeling ◽  
Low Coherence
Sign in / Sign up

Export Citation Format

Share Document