Process monitor gratings

2007 ◽  
Author(s):  
T. A. Brunner ◽  
C. P. Ausschnitt
Keyword(s):  
Process Monitor

New process monitor for reticles and wafers: the MEEF meter

2000 ◽  
Author(s):  
Franklin M. Schellenberg ◽  
Pat LaCour ◽  
Olivier Toublan ◽  
Geoffrey T. Anderson ◽  
Raymond Yip
Keyword(s):  
New Process ◽  
Process Monitor

A New Real-Time Process Monitor Method Based on MRC

2014 ◽  
Vol 971-973 ◽  
pp. 1481-1484
Author(s):  
Ke He Wu ◽  
Long Chen ◽  
Yi Li
Keyword(s):  
Information System ◽  
Real Time ◽  
Process Monitoring ◽  
Time Process ◽  
Monitoring Methods ◽  
Traditional Process ◽  
Kernel Level ◽  
Process Monitor

In order to ensure safe and stable running of applications, this paper analyses the limitation of traditional process-monitoring methods, and then designs a new real-time process monitor method based on Mandatory Running Control (MRC) technology. This method not only can monitor the processes, but also can control them from system kernel level to improve the reliability and safety of applications, so as to ensure the security and stability of information system.

A business process monitor for a mobile phone recharging system

2008 ◽  
Vol 54 (9) ◽  
pp. 843-848 ◽  
Author(s):  
Ferdinando Campanile ◽  
Luigi Coppolino ◽  
Salvatore Giordano ◽  
Luigi Romano
Keyword(s):  
Mobile Phone ◽  
Business Process ◽  
Process Monitor

Process Monitor Using High-Resolution Nuclear Magnetic Resonance

1960 ◽  
Vol 52 (6) ◽  
pp. 487-489 ◽  
Author(s):  
Forrest Nelson ◽  
Charles Reilly ◽  
William Savage
Keyword(s):  
Nuclear Magnetic Resonance ◽  
Magnetic Resonance ◽  
High Resolution ◽  
Process Monitor ◽  
Nuclear Magnetic

An embedded process monitor test chip architecture

2010 ◽  
Author(s):  
Sachin Idgunji ◽  
Vikas Chandra ◽  
Cezary Pietrzyk ◽  
Imran Iqbal ◽  
Rob Aitken ◽  
...  
Keyword(s):  
Test Chip ◽  
Embedded Process ◽  
Process Monitor
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