Preliminary results from a multi-wavelength time domain optical molecular imaging system

2007 ◽  
Author(s):  
David J. Hall ◽  
Sung-Ho Han
Keyword(s):  
Molecular Imaging ◽  
Time Domain ◽  
Imaging System ◽  
Optical Molecular Imaging ◽  
Preliminary Results ◽  
Multi Wavelength

Full-field time domain optical molecular imaging system

2005 ◽  
Author(s):  
David J. Hall ◽  
David R. Vera ◽  
Robert F. Mattrey
Keyword(s):  
Molecular Imaging ◽  
Time Domain ◽  
Imaging System ◽  
Optical Molecular Imaging ◽  
Full Field

High sensitivity optical molecular imaging system

2018 ◽  
Author(s):  
Jie Tian ◽  
Yu An ◽  
Kun Wang ◽  
Peng Zhang ◽  
Yuan Gao ◽  
...  
Keyword(s):  
Molecular Imaging ◽  
Imaging System ◽  
High Sensitivity ◽  
Optical Molecular Imaging

Advanced Non-Destructive Fault Isolation Techniques for PCB Substrates Using Magnetic Current Imaging and Terahertz Time Domain Reflectometry

2018 ◽  
Author(s):  
Daechul Choi ◽  
Yoonseong Kim ◽  
Jongyun Kim ◽  
Han Kim
Keyword(s):  
Time Domain ◽  
Quantum Interference ◽  
Flip Chip ◽  
Imaging System ◽  
Time Domain Reflectometry ◽  
Fault Isolation ◽  
Magnetic Current ◽  
Isolation Techniques ◽  
Super Conducting ◽  
Non Destructive

Abstract In this paper, we demonstrate cases for actual short and open failures in FCB (Flip Chip Bonding) substrates by using novel non-destructive techniques, known as SSM (Scanning Super-conducting Quantum Interference Device Microscopy) and Terahertz TDR (Time Domain Reflectometry) which is able to pinpoint failure locations. In addition, the defect location and accuracy is verified by a NIR (Near Infra-red) imaging system which is also one of the commonly used non-destructive failure analysis tools, and good agreement was made.

NAOMI: nanoparticle assisted optical molecular imaging

2006 ◽  
Author(s):  
Dirk J. Faber ◽  
Mirjam E. J. van Velthoven ◽  
Martijn de Bruin ◽  
Maurice C. G. Aalders ◽  
Frank D. Verbraak ◽  
...  
Keyword(s):  
Molecular Imaging ◽  
Optical Molecular Imaging
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