Blu-ray type super resolution near field optical disk with Sb 2 Te 3 mask layers and a thermal shield layer in front of the mask layer

2007 ◽  
Author(s):  
L. P. Shi ◽  
T. C. Chong ◽  
X. Hu ◽  
J. M. Li ◽  
X. S. Miao ◽  
...  
Keyword(s):  
Near Field ◽  
Super Resolution ◽  
Optical Disk ◽  
Thermal Shield ◽  
Mask Layer

Super-resolution near-field optical disk with a thermal shield layer behind recording layer

2007 ◽  
Author(s):  
L. P. Shi ◽  
T. C. Chong ◽  
J. Y. Sze ◽  
J. M. Li ◽  
X. S. Miao ◽  
...  
Keyword(s):  
Near Field ◽  
Super Resolution ◽  
Optical Disk ◽  
Thermal Shield ◽  
Recording Layer

Blu-ray Type Super Resolution Near Field Optical Disk with Sb70Te30 or Sb2Te3 Mask Layer

2006 ◽  
Author(s):  
L.P. Shi ◽  
T.C. Chong ◽  
X. Hu ◽  
J.M. Li ◽  
K.C. Zhao ◽  
...  
Keyword(s):  
Near Field ◽  
Super Resolution ◽  
Optical Disk ◽  
Mask Layer

Super-resolution near-field optical disk with a thermal shield layer behind recording layer

2007 ◽  
Author(s):  
L. P. Shi ◽  
T. C. Chong ◽  
J. Y. Sze ◽  
J. M. Li ◽  
X. S. Miao ◽  
...  
Keyword(s):  
Near Field ◽  
Super Resolution ◽  
Optical Disk ◽  
Thermal Shield ◽  
Recording Layer

Super-Resolution Readout for Magneto-Optical Disk by Optimizing the Deposition Condition of Non-Magnetic Mask Layer

2001 ◽  
Vol 674 ◽  
Author(s):  
Takayuki Shima ◽  
Johoo Kim ◽  
Hiroshi Fuji ◽  
Nobufumi Atoda ◽  
Junji Tominaga
Keyword(s):  
Silver Oxide ◽  
Near Field ◽  
Numerical Aperture ◽  
Super Resolution ◽  
Laser Wavelength ◽  
Deposition Condition ◽  
Resolution Limit ◽  
Plasma Sputtering ◽  
Mask Layer ◽  
Disk Structure

ABSTRACTSuper-resolution near-field structure (Super-RENS) was prepared by a heliconwave-plasma sputtering method to improve the disk property that is combined with a magneto-optical (MO) recording disk. Antimony and silver-oxide mask layers were prepared by the method and refractive indices were measured. Recording and retrieving of signals beyond the resolution limit (<370 nm) were achieved for both mask cases. Attempts to optimize the disk structure were also made using a conventional sputtering method. The smallest mark size was around 200 nm and the highest carrier-to-noise ratio (CNR) was 30 dB for 300-nm mark and 22 dB for 250-nm, when using a laser wavelength of 780 nm and a numerical aperture of 0.53. We have found that there is a competing super-resolutional mechanism besides Super-RENS that appears when high readout laser power is applied. This mechanism played rather an important role at least in the mark-size range of 200-370 nm.

Recording and readout mechanisms of super-resolution near-field structure disk with a silver oxide mask layer

2003 ◽  
Vol 83 (11) ◽  
pp. 2136-2138 ◽  
Author(s):  
Yung-Chiun Her ◽  
Yuh-Chang Lan ◽  
Wei-Chih Hsu ◽  
Song-Yeu Tsai
Keyword(s):  
Silver Oxide ◽  
Near Field ◽  
Super Resolution ◽  
Field Structure ◽  
Mask Layer
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