Second-order nonlinear thin film characterization using logarithmic Hilbert transform

2006 ◽  
Author(s):  
Aydogan Ozcan
Keyword(s):  
Thin Film ◽  
Hilbert Transform ◽  
Second Order ◽  
Thin Film Characterization

High-temperature superconductor thin-film characterization by the modulated optical reflectance technique

1995 ◽  
Vol 8 (8) ◽  
pp. 667-672 ◽  
Author(s):  
D P Almond ◽  
A K Barker ◽  
A C Bento ◽  
S K Singh ◽  
N J Appleyard ◽  
...  
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
High Temperature Superconductor ◽  
Optical Reflectance ◽  
Thin Film Characterization

Ferroelectric thin-film characterization using a coplanar waveguide bandstop filter

2006 ◽  
Vol 203 (2) ◽  
pp. 379-385
Author(s):  
Qingduan Meng ◽  
Xueqiang Zhang ◽  
Fei Li ◽  
Jiandong Huang ◽  
Xiaohong Zhu ◽  
...  
Keyword(s):  
Thin Film ◽  
Coplanar Waveguide ◽  
Ferroelectric Thin Film ◽  
Thin Film Characterization ◽  
Bandstop Filter

scholarly journals Parallel spectroscopic ellipsometry for ultra-fast thin film characterization

2020 ◽  
Vol 28 (7) ◽  
pp. 9288 ◽  
Author(s):  
Andrey Nazarov ◽  
Michael Ney ◽  
Ibrahim Abdulhalim
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry ◽  
Thin Film Characterization

Photocross-Linked Second Order Nonlinear Optical Polymers

1990 ◽  
Vol 214 ◽  
Author(s):  
Y. M. Chen ◽  
B. K. Mandal ◽  
J. Y. Lee ◽  
P. Miller ◽  
J. Kumar ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Nonlinear Optical ◽  
Nonlinear Coefficient ◽  
Second Order ◽  
Optical Polymers ◽  
Nlo Properties ◽  
Polymeric Thin Films ◽  
Nonlinear Optical Polymers ◽  
Novel Method

ABSTRACTWe report a novel method to obtain stable second order nonlinear optical (NLO) properties in polymeric thin films. Photocross-linking between the NLO active molecules and a photoreactive polymer is achieved by UV irradiation subsequent to poling. The thin film exhibits a nonlinear coefficient d33of 16.5 pm/V at a doping level of 20% by weight of NLO active molecules and possesses quite stable second order nonlinear optical properties

Infrared reflectance measurement for InN thin film characterization

2006 ◽  
Vol 3 (6) ◽  
pp. 1874-1878 ◽  
Author(s):  
K. Fukui ◽  
Y. Kugumiya ◽  
N. Nakagawa ◽  
A. Yamamoto
Keyword(s):  
Thin Film ◽  
Infrared Reflectance ◽  
Reflectance Measurement ◽  
Thin Film Characterization
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