Growth of bismuth silicon oxide and bismuth germanium oxide crystals by Czochralski technique

1992 ◽  
Author(s):  
R. Gopalakrishnan ◽  
D. Krishnamurthy ◽  
Dakshanamoorthy Arivuoli ◽  
P. Ramasamy
Keyword(s):  
Silicon Oxide ◽  
Germanium Oxide ◽  
Czochralski Technique ◽  
Bismuth Silicon Oxide ◽  
Bismuth Germanium Oxide ◽  
Oxide Crystals

Synchrotron X-ray topography of bismuth silicon oxide crystals

1996 ◽  
Vol 166 (1-4) ◽  
pp. 325-328 ◽  
Author(s):  
J. Martínez-López ◽  
M. González-Mañas ◽  
M.A. Caballero ◽  
E. Diéguez ◽  
B. Capelle
Keyword(s):  
Silicon Oxide ◽  
Bismuth Silicon Oxide ◽  
X Ray ◽  
Oxide Crystals

scholarly journals Single crystals of bismuth silicon oxide grown by the czochralski technique and their characterisation

1999 ◽  
Vol 64 (9) ◽  
pp. 553-561 ◽  
Author(s):  
Aleksandar Golubovic ◽  
Slobodanka Nikolic ◽  
Rados Gajic ◽  
Stevan Djuric ◽  
Andreja Valcic
Keyword(s):  
Optical Properties ◽  
Single Crystals ◽  
Silicon Oxide ◽  
Critical Diameter ◽  
Lattice Parameters ◽  
Published Data ◽  
Czochralski Technique ◽  
Critical Rate ◽  
Bismuth Silicon Oxide ◽  
X Ray

Single crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical properties of the bismuth silicon oxide single crystals were investigated. The obtained results are discussed and compared with published data.

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