Single crystals of bismuth silicon oxide grown by the czochralski technique and their characterisation
1999 ◽
Vol 64
(9)
◽
pp. 553-561
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Keyword(s):
Single crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical properties of the bismuth silicon oxide single crystals were investigated. The obtained results are discussed and compared with published data.
1999 ◽
Vol 64
(10)
◽
pp. 637-646
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2011 ◽
Vol 76
(11)
◽
pp. 1561-1566
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2004 ◽
Vol 69
(6)
◽
pp. 493-502
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Keyword(s):
2000 ◽
Vol 65
(9)
◽
pp. 611-618
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