Broadband RF imaging and spectrum analysis using spatial-spectral hole-burning in an inhomogeneously broadened absorber

Author(s):  
Youzhi Li ◽  
Benjamin Braker ◽  
Friso Schlottau ◽  
Donghua Gu ◽  
Max Colice ◽  
...  
2004 ◽  
Author(s):  
Max Colice ◽  
Friso Schlottau ◽  
Kelvin Wagner ◽  
R. Krishna Mohan ◽  
William R. Babbitt ◽  
...  

1987 ◽  
Vol 48 (C5) ◽  
pp. C5-511-C5-515 ◽  
Author(s):  
J. L. OUDAR ◽  
J. DUBARD ◽  
F. ALEXANDRE ◽  
D. HULIN ◽  
A. MIGUS ◽  
...  

1998 ◽  
Vol 512 ◽  
Author(s):  
C. Hecht ◽  
R. Kummer ◽  
A. Winnacker

ABSTRACTIn the context of spectral-hole burning experiments in 4H- and 6H-SiC doped with vanadium the energy positions of the V4+/5+ level in both polytypes were determined in order to resolve discrepancies in literature. From these numbers the band offset of 6H/4H-SiC is calculated by using the Langer-Heinrich rule, and found to be of staggered type II. Furthermore the experiments show that thermally stable electronic traps exist in both polytypes at room temperature and considerably above, which may result in longtime transient shifts of electronic properties.


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