A novel phase measurement profilometry based on linear CCD array

2005 ◽  
Author(s):  
Hong Zhao ◽  
Zhihua Zhao ◽  
Kejian Jiang ◽  
Yuanhe Song
Keyword(s):  
Phase Measurement ◽  
Linear Ccd ◽  
Ccd Array

Sensitivity of linear CCD array based film scanners used for film dosimetry

2006 ◽  
Vol 33 (11) ◽  
pp. 3993-3996 ◽  
Author(s):  
Slobodan Devic ◽  
Yi-Zhen Wang ◽  
Nada Tomic ◽  
Ervin B. Podgorsak
Keyword(s):  
Film Dosimetry ◽  
Linear Ccd ◽  
Ccd Array

Displacement sensor using channelled spectrum dispersed on a linear CCD array

1993 ◽  
Vol 29 (10) ◽  
pp. 896-897 ◽  
Author(s):  
S. Taplin ◽  
A.Gh. Podoleanu ◽  
D.J. Webb ◽  
D.A. Jackson
Keyword(s):  
Displacement Sensor ◽  
Linear Ccd ◽  
Ccd Array

White Light Interferometer Using Linear Ccd Array with Signal Processing

1995 ◽  
pp. 831-832
Author(s):  
Stephen R. Taplin ◽  
Adrian G. Podoleanu ◽  
David J. Webb ◽  
David A. Jackson
Keyword(s):  
Signal Processing ◽  
White Light ◽  
White Light Interferometer ◽  
Linear Ccd ◽  
Ccd Array

scholarly journals FPGA-Based On-Board Geometric Calibration for Linear CCD Array Sensors

Sensors ◽  
2018 ◽  
Vol 18 (6) ◽  
pp. 1794 ◽  
Author(s):  
Guoqing Zhou ◽  
Linjun Jiang ◽  
Jingjin Huang ◽  
Rongting Zhang ◽  
Dequan Liu ◽  
...  
Keyword(s):  
Geometric Calibration ◽  
Linear Ccd ◽  
Ccd Array

A Star Mapper Using Linear CCD Array

1984 ◽  
Author(s):  
Y. K. Jain ◽  
V.Koteswara Rao ◽  
D.V.B. Rao ◽  
N. J. Babu
Keyword(s):  
Linear Ccd ◽  
Ccd Array

Performance and applications of the holography electron microscope

1993 ◽  
Vol 51 ◽  
pp. 1078-1079
Author(s):  
Akira Tonomura
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Phase Measurement ◽  
Electron Holography ◽  
Imaging Method ◽  
High Contrast ◽  
Magnetic Lens ◽  
High Brightness ◽  
Holographic Imaging ◽  
Dynamic Observation

Electron holography is a two-step imaging method. However, the ultimate performance of holographic imaging is mainly determined by the brightness of the electron beam used in the hologram-formation process. In our 350kV holography electron microscope (see Fig. 1), the decrease in the inherently high brightness of field-emitted electrons is minimized by superposing a magnetic lens in the gun, for a resulting value of 2 × 109 A/cm2 sr. This high brightness has lead to the following distinguished features. The minimum spacing (d) of carrier fringes is d = 0.09 Å, thus allowing a reconstructed image with a resolution, at least in principle, as high as 3d=0.3 Å. The precision in phase measurement can be as high as 2π/100, since the position of fringes can be known precisely from a high-contrast hologram formed under highly collimated illumination. Dynamic observation becomes possible because the current density is high.

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