Delta doping for deep-level analysis in semiconductor diodes

1992 ◽  
Author(s):  
Joachim Piprek ◽  
H. Kostial ◽  
Peter Krispin ◽  
C. H. Lange ◽  
Karl W. Boer
Keyword(s):  
Deep Level ◽  
Delta Doping ◽  
Level Analysis

Delta Doping for Deep Level Analysis in Semiconductors

1992 ◽  
Vol 281 ◽  
Author(s):  
J. Piprek ◽  
P. Krispin ◽  
H. Kostial ◽  
K. W. BÖer
Keyword(s):  
Deep Level ◽  
Schottky Diodes ◽  
Device Simulation ◽  
Simulation Software ◽  
Level Energy ◽  
New Approach ◽  
Delta Doping ◽  
Capacitance Voltage ◽  
Defects In Semiconductors ◽  
Level Analysis

ABSTRACTThe occupation of deep-level defects in semiconductors is investigated by delta-doping such impurities at a specified distance from the metallurgical boundary within Schottky diodes. Capacitance-voltage characteristics are analyzed using ID device simulation software. These characteristics change significantly depending on the deep-level energy and the sheet position. This new approach to deep-level analysis is applied to Schottky diodes on MBE-grown n-GaAs with a planar titanium doped sheet. At moderate Ti concentrations the well-known Ti acceptor level near Ec-0.2 eV governs the electrical properties. In addition, two other types of Ti defects are found.

Mitigating Risk

2011 ◽  
Vol 2 (2) ◽  
pp. 67-75 ◽  
Author(s):  
Ken Lozito
Keyword(s):  
Planning Process ◽  
Deep Level ◽  
Historical Event ◽  
Event Management ◽  
Efficient Manner ◽  
Business Decision ◽  
Security Event ◽  
Security Information ◽  
Security Standards ◽  
Level Analysis

Business Intelligence (BI) has often been described as the tools and systems that play an essential role in the strategic planning process of a corporation. The application of BI is most commonly associated with the analysis of sales and stock trends, pricing and customer behavior to inform business decision-making. There is a growing trend in utilizing the tools and processes used in the analysis of data and applying them to security event management. Security Information and Event Management (SIEM) has emerged within the last 10 years providing a centralized source to enable both real-time and deep level analysis of historical event data to drive security standards and align IT resources in a more efficient manner.

Mitigating Risk

2012 ◽  
pp. 261-269
Author(s):  
Ken Lozito
Keyword(s):  
Planning Process ◽  
Deep Level ◽  
Historical Event ◽  
Event Management ◽  
Efficient Manner ◽  
Business Decision ◽  
Security Event ◽  
Security Information ◽  
Security Standards ◽  
Level Analysis

Business Intelligence (BI) has often been described as the tools and systems that play an essential role in the strategic planning process of a corporation. The application of BI is most commonly associated with the analysis of sales and stock trends, pricing and customer behavior to inform business decision-making. There is a growing trend in utilizing the tools and processes used in the analysis of data and applying them to security event management. Security Information and Event Management (SIEM) has emerged within the last 10 years providing a centralized source to enable both real-time and deep level analysis of historical event data to drive security standards and align IT resources in a more efficient manner.

Deep level analysis of undoped Gax In1-x P/GaAs single heterojunctions grown by MOMBE and MOVPE

1992 ◽  
Vol 33 (1-2) ◽  
pp. 63-66 ◽  
Author(s):  
E.C. Paloura ◽  
A. Ginoudi ◽  
G. Constandinidis ◽  
G. Kiriakidis
Keyword(s):  
Deep Level ◽  
Level Analysis

Deep level analysis of radiation-induced defects in Si crystals and solar cells

1999 ◽  
Vol 86 (1) ◽  
pp. 217-223 ◽  
Author(s):  
Masafumi Yamaguchi ◽  
Aurangzeb Khan ◽  
Stephen J. Taylor ◽  
Koshi Ando ◽  
Tsutomu Yamaguchi ◽  
...  
Keyword(s):  
Solar Cells ◽  
Deep Level ◽  
Radiation Induced ◽  
Induced Defects ◽  
Level Analysis

Deep level analysis in heterostructure field-effect transistors by means of the photo-FET method

1986 ◽  
Vol 33 (5) ◽  
pp. 693-697 ◽  
Author(s):  
M. Heuken ◽  
L. Loreck ◽  
K. Heime ◽  
K. Ploog ◽  
W. Schlapp ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Deep Level ◽  
Heterostructure Field Effect Transistors ◽  
Level Analysis

Deep‐level analysis ofn‐type GaAs1−xPxalloys

1995 ◽  
Vol 78 (2) ◽  
pp. 1004-1007 ◽  
Author(s):  
M. M. Ben Salem ◽  
M. A. Zaidi ◽  
H. Maaref ◽  
J. C. Bourgoin
Keyword(s):  
Deep Level ◽  
Level Analysis
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