In-situ characterization of thin film semiconductors by spectroellipsometry from ultraviolet to infrared
Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
◽
Keyword(s):
2012 ◽
Keyword(s):
2015 ◽
Vol 162
(4)
◽
pp. A727-A736
◽
Keyword(s):
1992 ◽
Vol 10
(4)
◽
pp. 1472-1478
◽
2018 ◽
Vol 57
(3S2)
◽
pp. 03EG14
◽