In-situ characterization of thin film semiconductors by spectroellipsometry from ultraviolet to infrared

Author(s):  
Bernard Drevillon
2005 ◽  
Vol 38 (24) ◽  
pp. 10109-10116 ◽  
Author(s):  
Todd M. Roper ◽  
Tai Yeon Lee ◽  
C. Allan Guymon ◽  
Charles E. Hoyle

2016 ◽  
Vol 285 ◽  
pp. 118-121 ◽  
Author(s):  
Masakazu Haruta ◽  
Susumu Shiraki ◽  
Takeo Ohsawa ◽  
Tohru Suzuki ◽  
Akichika Kumatani ◽  
...  

2015 ◽  
Vol 162 (4) ◽  
pp. A727-A736 ◽  
Author(s):  
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Daniel Albrecht ◽  
Julian Fischer ◽  
Svetlozar Ivanov ◽  
Andreas Bund ◽  
...  

2018 ◽  
Vol 57 (3S2) ◽  
pp. 03EG14 ◽  
Author(s):  
Takeshi Watanabe ◽  
Tomoyuki Koganezawa ◽  
Mamoru Kikuchi ◽  
Hiroki Muraoka ◽  
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...  

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