Influence of probe tip size and incident light polarization on resolution in near-field scanning optical microscopy

2005 ◽  
Author(s):  
Guiying Wang ◽  
Qinghua Wu ◽  
Zhizhan Xu
Keyword(s):  
Optical Microscopy ◽  
Incident Light ◽  
Near Field ◽  
Light Polarization ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy for characterisation of photovoltaic materials

2004 ◽  
Vol 1 (9) ◽  
pp. 2292-2297 ◽  
Author(s):  
E. E. van Dyk ◽  
A. Karoui ◽  
A. H. La Rosa ◽  
G. Rozgonyi
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Photovoltaic Materials ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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