The use of advanced light source and signal processing in scanning optical microscopy

2003 ◽  
Author(s):  
Fu-Jen Kao
Keyword(s):  
Signal Processing ◽  
Optical Microscopy ◽  
Light Source ◽  
Advanced Light Source ◽  
Scanning Optical Microscopy

Scanning Optical Microscopy with an Electrogenerated Chemiluminescent Light Source at a Nanometer Tip

2001 ◽  
Vol 73 (10) ◽  
pp. 2153-2156 ◽  
Author(s):  
Yanbing Zu ◽  
Zhifeng Ding ◽  
Junfeng Zhou ◽  
Youngmi Lee ◽  
Allen J. Bard
Keyword(s):  
Optical Microscopy ◽  
Light Source ◽  
Scanning Optical Microscopy

Near-Field Scanning Optical Microscopy Studies of Materials and Devices

MRS Bulletin ◽  
1997 ◽  
Vol 22 (8) ◽  
pp. 27-30 ◽  
Author(s):  
J.W.P. Hsu
Keyword(s):  
Optical Microscopy ◽  
Light Source ◽  
Optical Fibers ◽  
Force Feedback ◽  
Near Field ◽  
Single Mode ◽  
Field Zone ◽  
Research Activities ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy (NSOM) provides a means to study optical and optoelectronic properties of materials at the nanometer scale. The key to achieving resolution higher than the diffraction limit is to place a subwavelength-sized light source—e.g., an aperture—within the near-field zone of the sample. In this case, the area of the sample illuminated is determined by the aperture size and not by the wavelength (see Figure 1). An image can then be formed by moving the sample and light source with respect to each other. While the principle of near-field optics is straightforward, its realization at visible-light wavelengths was not achieved until the invention of scanning-probe techniques in the 1980s. Since Betzig et al. demonstrated in 1991 that bright subwavelength apertures can be made by tapering and metal-coating single-mode optical fibers, research activities involving NSOM have increased tremendously. The later incorporation of shear-force feedback to regulate tip-sample separation adds another strength to NSOM. Using this distance regulation, a topographic image similar to that obtained by a conventional scanning force microscope is acquired simultaneously with the optical image. This provides a way to correlate structural and physical properties at the same sample positions and greatly simplifies interpretation of the NSOM data.

X-ray microscopy by phase-retrieval methods at the advanced light source

2003 ◽  
Vol 104 ◽  
pp. 557-561 ◽  
Author(s):  
M. R. Howells ◽  
H. Chapman ◽  
S. Hau-Riege ◽  
H. He ◽  
S. Marchesini ◽  
...  
Keyword(s):  
Light Source ◽  
Phase Retrieval ◽  
X Ray ◽  
Advanced Light Source

Advanced Light Source Operation and Critical Research during the COVID-19 Pandemic

2021 ◽  
Vol 34 (1-3) ◽  
pp. 27-29
Author(s):  
A. Scholl, ◽  
D. Parkinson ◽  
R. Koch, ◽  
L. Tamura
Keyword(s):  
Light Source ◽  
Critical Research ◽  
Advanced Light Source ◽  
Source Operation

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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