Fabrication of large-area x-rays masks for UDXRL on beryllium using thin film UV lithography and x-ray backside exposure

2004 ◽  
Author(s):  
Josef Kouba ◽  
Zhong-Geng Ling ◽  
Lin Wang ◽  
Yohannes M. Desta ◽  
Jost Goettert
Keyword(s):  
Thin Film ◽  
X Rays ◽  
Large Area ◽  
X Ray ◽  
Uv Lithography ◽  
Area X

scholarly journals Study of recent outburst in the Be/X-ray binary RX J0209.6−7427 with AstroSat: a new ultraluminous X-ray pulsar in the Magellanic Bridge?

2020 ◽  
Vol 495 (3) ◽  
pp. 2664-2672 ◽  
Author(s):  
Amar Deo Chandra ◽  
Jayashree Roy ◽  
P C Agrawal ◽  
Manojendu Choudhury
Keyword(s):  
Energy Band ◽  
Spectral Characteristics ◽  
Spectral Studies ◽  
X Rays ◽  
Energy Bands ◽  
Large Area ◽  
Pulse Profile ◽  
X Ray ◽  
Outburst Energy ◽  
Area X

ABSTRACT We present the timing and spectral studies of RX J0209.6–7427 during its rare 2019 outburst using observations with the Soft X-ray Telescope (SXT) and Large Area X-ray Proportional Counter (LAXPC) instruments on the AstroSat satellite. Pulsations having a periodicity of 9.29 s were detected for the first time by the NICER mission in the 0.2–10 keV energy band and, as reported here, by AstroSat over a broad energy band covering 0.3–80 keV. The pulsar exhibits a rapid spin-up during the outburst. Energy resolved folded pulse profiles are generated in several energy bands in 3–80 keV. To the best of our knowledge this is the first report of the timing and spectral characteristics of this Be binary pulsar in hard X-rays. There is suggestion of evolution of the pulse profile with energy. The energy spectrum of the pulsar is determined and from the best-fitting spectral values, the X-ray luminosity of RX J0209.6−7427 is inferred to be 1.6 × 1039 erg s−1. Our timing and spectral studies suggest that this source has features of an ultraluminous X-ray pulsar in the Magellanic Bridge. Details of the results are presented and discussed in terms of the current ideas.

scholarly journals Antiscattering X-ray fluorescence analysis for large-area samples

2019 ◽  
Vol 34 (11) ◽  
pp. 2273-2279 ◽  
Author(s):  
Wenyang Zhao ◽  
Keiichi Hirano ◽  
Kenji Sakurai
Keyword(s):  
Fluorescence Analysis ◽  
X Rays ◽  
Large Area ◽  
X Ray ◽  
Area X

The scattering background in large-area X-ray fluorescence analysis (more than one square centimeter) has been greatly reduced by using highly polarized X-rays and by inserting a collimator plate between the sample and the detector.

Fabrication of Carbon Membrane X-Ray Mask for X-Ray Lithography

2010 ◽  
Author(s):  
Daiji Noda ◽  
Naoki Takahashi ◽  
Atsushi Tokuoka ◽  
Megumi Katori ◽  
Tadashi Hattori
Keyword(s):  
Imaging Techniques ◽  
Effective Area ◽  
Phase Imaging ◽  
X Rays ◽  
Carbon Membrane ◽  
Large Area ◽  
X Ray ◽  
Thin Carbon ◽  
Area X ◽  
Talbot Interferometry

X-ray radiographic imaging techniques have been applied in many fields. Previously we proposed a method for X-ray phase imaging using X-ray Talbot interferometry which requires the use of X-ray gratings. In this work, we fabricated the X-ray gratings needed for X-ray Talbot interferometry using an X-ray lithography technique. For X-ray lithography the accuracy of the fabricated structure depends largely on the accuracy of the X-ray mask. Conventionally a resin material is used for the support membrane for large area X-ray masks. However, resin membranes have the disadvantage that they can sag after several cycles of X-ray exposure due to the heat generated by the X-rays. For our new proposal we used thin carbon wafers for the membrane material because carbon has an extremely small thermal expansion coefficient. This new type of X-ray mask is very easy to process, and it is expected that it will lead to more precise X-ray masks. We fabricated carbon membrane X-ray masks on 6 inch wafers with a 1:1 line-to-space ratio and a pitch of 5.3 μm, covering a large effective area of 100 × 100 mm2.

Problems in Thin-Film X-ray Quantification

1990 ◽  
Vol 48 (2) ◽  
pp. 458-459
Author(s):  
J N Chapman ◽  
W A P Nicholson
Keyword(s):  
Thin Film ◽  
Specimen Thickness ◽  
X Rays ◽  
Characteristic Peak ◽  
Local Composition ◽  
X Ray ◽  
Measured Ratio ◽  
Path Lengths ◽  
Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

A large area X-ray imager with online linearization and noise suppression

2011 ◽  
Author(s):  
T. He ◽  
R. Durst ◽  
B. L. Becker ◽  
J. Kaercher ◽  
G. Wachter
Keyword(s):  
Noise Suppression ◽  
Large Area ◽  
X Ray ◽  
Area X

scholarly journals Synchrotron X-ray Microdiffraction Images of Polarization Switching in Epitaxial PZT Capacitors with Pt and SrRuO3 Top Electrodes

2003 ◽  
Vol 784 ◽  
Author(s):  
Dal-Hyun Do ◽  
Dong Min Kim ◽  
Chang-Beom Eom ◽  
Eric M. Dufresne ◽  
Eric D. Isaacs ◽  
...  
Keyword(s):  
Thin Film ◽  
Bottom Electrode ◽  
Sputter Deposition ◽  
Ferroelectric Polarization ◽  
X Rays ◽  
X Ray ◽  
Pzt Film ◽  
Thin Film Capacitors ◽  
Pzt Thin Film ◽  
Switchable Polarization

ABSTRACTThe evolution of stored ferroelectric polarization in PZT thin film capacitors was imaged using synchrotron x-ray microdiffraction with a submicron-diameter focused incident x-ray beam. To form the capacitors, an epitaxial Pb(Zr,Ti)O3 (PZT) thin film was deposited on an epitaxially-grown conductive SrRuO3 (SRO) bottom electrode on a SrTiO3 (STO) (001) substrate. Polycrystalline SRO or Pt top electrodes were prepared by sputter deposition through a shadow mask and subsequent annealing. The intensity of x-ray reflections from the PZT film depended on the local ferroelectric polarization. With 10 keV x-rays, regions of opposite polarization differed in intensity by 26% in our PZT capacitor with an SRO top electrode. Devices with SRO electrodes showed just a 25% decrease in the remnant polarization after 107 switching cycles. In devices with Pt top electrodes, however, the switchable polarization decreased a by 70% after only 5×104 cycles.

Energy distribution of μd1s muonic atom and its spin states effecting on muonic X-Ray transfer yield in solid thin film method

2014 ◽  
Vol 23 (02) ◽  
pp. 1450006 ◽  
Author(s):  
R. Gheisari ◽  
M. Afshari ◽  
K. Khorshidian
Keyword(s):  
Thin Film ◽  
Energy Distribution ◽  
Muonic Atom ◽  
Rate Equations ◽  
Spin States ◽  
X Rays ◽  
X Ray ◽  
Solid Deuterium ◽  
Molecular Formation ◽  
Film Method

We have investigated the energy distribution of [Formula: see text] and its spin states (F) effecting on muonic X-ray transfer yield in the solid thin film method. Argon ( Ar ) ion has been considered as the implanted ion in solid deuterium (s D 2) layer at a temperature of T = 3 K. A kinetics model has been used, the corresponding rate equations have been constructed and our results of X-ray yield have been compared with recent measured data. The μd1s muonic atoms, which can take part in resonant molecular formation, have been separated from atoms participating in nonresonant reactions. On this basis, the integrated number of X-rays has been calculated. The results show that the effect of μd1s energy distribution on the number of X-photons is not serious, while its spin states strongly affect the muonic X-ray yield.

The XFM beamline at the Australian Synchrotron

2020 ◽  
Vol 27 (5) ◽  
pp. 1447-1458 ◽  
Author(s):  
Daryl L. Howard ◽  
Martin D. de Jonge ◽  
Nader Afshar ◽  
Chris G. Ryan ◽  
Robin Kirkham ◽  
...  
Keyword(s):  
Materials Science ◽  
Energy Detection ◽  
Array Detector ◽  
X Rays ◽  
X Ray Diffraction ◽  
High Definition ◽  
Large Area ◽  
X Ray ◽  
Diffraction Microscopy ◽  
System Time

The X-ray fluorescence microscopy (XFM) beamline is an in-vacuum undulator-based X-ray fluorescence (XRF) microprobe beamline at the 3 GeV Australian Synchrotron. The beamline delivers hard X-rays in the 4–27 keV energy range, permitting K emission to Cd and L and M emission for all other heavier elements. With a practical low-energy detection cut-off of approximately 1.5 keV, low-Z detection is constrained to Si, with Al detectable under favourable circumstances. The beamline has two scanning stations: a Kirkpatrick–Baez mirror microprobe, which produces a focal spot of 2 µm × 2 µm FWHM, and a large-area scanning `milliprobe', which has the beam size defined by slits. Energy-dispersive detector systems include the Maia 384, Vortex-EM and Vortex-ME3 for XRF measurement, and the EIGER2 X 1 Mpixel array detector for scanning X-ray diffraction microscopy measurements. The beamline uses event-mode data acquisition that eliminates detector system time overheads, and motion control overheads are significantly reduced through the application of an efficient raster scanning algorithm. The minimal overheads, in conjunction with short dwell times per pixel, have allowed XFM to establish techniques such as full spectroscopic XANES fluorescence imaging, XRF tomography, fly scanning ptychography and high-definition XRF imaging over large areas. XFM provides diverse analysis capabilities in the fields of medicine, biology, geology, materials science and cultural heritage. This paper discusses the beamline status, scientific showcases and future upgrades.

scholarly journals X-Ray Astronomy Satellite Ginga

1990 ◽  
Vol 123 ◽  
pp. 41-48
Author(s):  
F. Makino
Keyword(s):  
Gamma Ray ◽  
Effective Area ◽  
X Rays ◽  
Scientific Instruments ◽  
Large Area ◽  
Gamma Ray Burst ◽  
X Ray ◽  
Proportional Counters ◽  
Main Instrument

AbstractThe X-ray astronomy satellite Ginga carries three scientific instruments, the Large Area proportional Counters (LAC), All Sky X-ray Monitor (ASM) and Gamma-ray Burst Detector (GBD). The LAC is the main instrument with an effective area of 4000 cm2 giving it the highest sensitivity to hard X-rays so far achieved. Ginga observed about 250 targets up to the end of 1989.

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