Short-wavelength static optical recording properties of nickel phthalocynine thin film

2003 ◽  
Author(s):  
Yiqun Wu ◽  
Yang Wang ◽  
Donghong Gu ◽  
Fuxi Gan
Keyword(s):  
Thin Film ◽  
Short Wavelength ◽  
Optical Recording

Electron Microscopy Study on Amorphous Ge-Sb-Te Thin Film for Phase Change Optical Recording

2003 ◽  
Vol 42 (Part 2, No. 10A) ◽  
pp. L1158-L1160 ◽  
Author(s):  
Muneyuki Naito ◽  
Manabu Ishimaru ◽  
Yoshihiko Hirotsu ◽  
Masaki Takashima
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Phase Change ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Optical Recording

ELASTIC PROPERTIES OF METAL SUPERLATTICES

1985 ◽  
Vol 56 ◽  
Author(s):  
A.F. JANKOWSKI ◽  
T. TSAKALAKOS
Keyword(s):  
Thin Film ◽  
Elastic Properties ◽  
Elastic Constants ◽  
Vapor Deposition ◽  
Short Wavelength ◽  
Plastic Behavior ◽  
Average Composition ◽  
Strain Effects ◽  
Modulated Structure ◽  
Appreciable Increase

AbstractThe elastic properties of modulated structure materials are presented. An enhanced modulus effect has been observed in several composition modulated thin film systems containing short wavelength modulations.8-10nm. The foils were produced by vapor deposition using two or three source evaporator. As compared with homogeneous foils of the same average composition, the modulated foils exhibited an appreciable increase (up to 300%) in modulus. The dependence of various moduli on the modulation parameters (wavelength, composition and amplitude) are described. The plastic behavior, breaking and microhardness of these foils are also presented as a function of the modulation parameters. Current theories based on electronic and strain effects on the elastic constants of metals are also presented to explain the origin of the supermodulus effect.

Thin-Film Photodetector Optimization for High-Performance Short-Wavelength Infrared Imaging

2021 ◽  
pp. 1-1
Author(s):  
Vladimir Pejovic ◽  
Jiwon Lee ◽  
Epimitheas Georgitzikis ◽  
Yunlong Li ◽  
Joo Hyoung Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Short Wavelength ◽  
High Performance ◽  
Infrared Imaging

GeCu/Si Bilayer Thin Film for Write-Once Blue Laser Optical Recording Media

2010 ◽  
Vol 123-125 ◽  
pp. 687-690
Author(s):  
Sin Liang Ou ◽  
Po Cheng Kuo ◽  
Don Yau Chiang ◽  
Chin Yen Yeh ◽  
Shih Hsien Ma ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Analysis ◽  
Optical Recording ◽  
Blue Laser ◽  
Bilayer Film ◽  
Recording Media ◽  
Dynamic Tests ◽  
Protective Layers ◽  
Temperature Ranges ◽  
Polycarbonate Substrate

GeCu(6 nm)/Si(6 nm) bilayer recording thin film was deposited on nature oxidized silicon wafer and polycarbonate substrate by magnetron sputtering. The ZnS-SiO2 films were used as protective layers. We have studied the thermal property, crystallization mechanism, and recording characteristics of the GeCu/Si bilayer thin film. Thermal analysis shows that the GeCu/Si bilayer film has two reflectivity changes with the temperature ranges, 120 °C ~ 165 °C and 310 °C ~ 340 °C. The results of dynamic tests show that the optimum jitter values at recording speeds of 1X and 4X are 5.8% and 5.9%, respectively. The modulations at 1X and 4X recording speeds are all larger than 0.4.

Preparation and short-wavelength optical storage properties of Ge-Te alloy phase change thin film

1998 ◽  
Author(s):  
Huiyong Liu ◽  
Fusong S. Jiang ◽  
Liqiu Q. Men ◽  
Zhengxiu Fan ◽  
Fuxi Gan
Keyword(s):  
Thin Film ◽  
Phase Change ◽  
Short Wavelength ◽  
Optical Storage ◽  
Storage Properties
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