FDM Helmholtz modeling of finite grating and waveguide width effects on resonant subwavelength grating reflectivity

2003 ◽  
Author(s):  
David W. Peters ◽  
Shanalyn A. Kemme ◽  
G. Ronald Hadley
Nanophotonics ◽  
2021 ◽  
Vol 10 (2) ◽  
pp. 1265-1272
Author(s):  
Mengyuan Ye ◽  
Chunlei Sun ◽  
Yu Yu ◽  
Yunhong Ding ◽  
Xinliang Zhang

Abstract Ring resonator is an essential element in silicon integrated circuit, it is widely used as filter, wavelength multiplexer and switch in single-mode operation regime. As the rapid development of mode division multiplexing (MDM) technique, ring resonator that can process multi-mode signals simultaneously and uniformly is highly desired. However, the severe modal dispersion makes identical transmission for different modes very hard. In this paper, by breaking through the limitation of conventional multi-mode manipulation design with evanescent coupling or mode interference, we propose and demonstrate a multi-mode ring resonator (MMRR) inspired by the free space geometric optics. Arbitrary number of supporting modes can be achieved by simply widening the waveguide width. For proof-of-concept demonstration, an MMRR supporting four modes is fabricated with uniform transmittance. Furthermore, architecture of cascaded four MMRRs are also demonstrated experimentally.


2020 ◽  
Vol 129 ◽  
pp. 106297 ◽  
Author(s):  
David González-Andrade ◽  
Antonio Dias ◽  
J. Gonzalo Wangüemert-Pérez ◽  
Alejandro Ortega-Moñux ◽  
Íñigo Molina-Fernández ◽  
...  

2015 ◽  
Vol 54 (9) ◽  
pp. 092203 ◽  
Author(s):  
Itsunari Yamada ◽  
Takaaki Ishihara ◽  
Junichi Yanagisawa

Photonics ◽  
2020 ◽  
Vol 7 (4) ◽  
pp. 104
Author(s):  
Anastasia Yakuhina ◽  
Alexey Kadochkin ◽  
Vyacheslav Svetukhin ◽  
Dmitry Gorelov ◽  
Sergey Generalov ◽  
...  

This article presents the results of the study of the influence of the most significant parameters of the side wall roughness of an ultra-thin silicon nitride lightguide layer of multimode integrated optical waveguides with widths of 3 and 8 microns. The choice of the waveguide width was made due to the need to provide multimode operation for telecommunication wavelengths, which is necessary to ensure high integration density. Scattering in waveguide structures was measured by optical frequency domain reflectometry (OFDR) of a backscattering reflectometer. The finite difference time domain method (FDTD) was used to study the effect of roughness parameters on optical losses in fabricated waveguides, the roughness parameters that most strongly affect optical scattering were determined, and methods of its significant reduction were specified. The prospects for implementing such structures on a quartz substrate are justified.


2017 ◽  
Vol 25 (3) ◽  
pp. 2918 ◽  
Author(s):  
Ge Gao ◽  
Ming Luo ◽  
Xiang Li ◽  
Yinglu Zhang ◽  
Qingzhong Huang ◽  
...  

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