Image plane tilt in optical systems

1991 ◽  
Author(s):  
Jose M. Sasian
Keyword(s):  
Image Plane ◽  
Optical Systems

Image plane tilt in optical systems

1992 ◽  
Vol 31 (3) ◽  
pp. 527 ◽  
Author(s):  
Jose M. Sasian
Keyword(s):  
Image Plane ◽  
Optical Systems

scholarly journals Dedicated optical systems of the Institute of Applied Optics

2019 ◽  
Vol 11 (2) ◽  
pp. 29 ◽  
Author(s):  
Dariusz Litwin ◽  
Jacek Galas ◽  
Marek Daszkiewicz ◽  
Tadeusz Kryszczyński ◽  
Adam Czyżewski ◽  
...  
Keyword(s):  
Incidence Angle ◽  
Science And Technology ◽  
High Vacuum ◽  
Polymeric Materials ◽  
Image Plane ◽  
Molecular Beams ◽  
Thickness Measurement ◽  
Optical Systems ◽  
Measurement Science ◽  
Applied Optics

The paper presents a collection of selected optical systems recently developed in the Institute of Applied Optics-INOS. The collection includes the family of techniques where the continuously modified wavelength facilitates high accuracy measurements of optical and geometrical features of the object in question i.e. the variable wavelength interferometry and confocal chromatic sensors. In addition, the paper refers to the construction of a new type of a spectrometer with rotating plasma and an illumination system supporting the road safety. Full Text: PDF ReferencesM. Pluta, Advanced Light Microscopy (Vol. 3, PWN, Elsevier, Warszawa-Amsterdam-London-New York-Tokyo, 1993). DirectLink M. Pluta, "Object-adapted variable-wavelength interferometry. I. Theoretical basis", Journal of Opt. Soc. Am., A4(11), 2107 (1987). CrossRef M. Pluta, "Variable wavelength microinterferometry of textile fibres", J. Microscopy, 149(2), 97 (1988). CrossRef M. Pluta, "On double‐refracting microinterferometers which suffer from a variable interfringe spacing across the image plane", Journal of Microscopy, 145(2), 191 (1987). CrossRef K. A. El-Farahaty, A. M. Sadik, A. M. Hezma, "Study of Optical and Structure Properties of Polyester (PET) and Copolyester (PETG) Fibers by Interferometry", International Journal of Polymeric Materials 56(7),715 (2007). CrossRef J. Galas, D. Litwin, M. Daszkiewicz, "New approach for identifying the zero-order fringe in variable wavelength interferometry", Proc. SPIE 10142, 101421R (2016). CrossRef A. Sadik, W. A. Ramadan, D. Litwin, "Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres", Measurement Science and Technology, IOP Publishing 14(10), 1753 (2003). CrossRef J. Galas, S. Sitarek; D. Litwin; M. Daszkiewicz, "Fringe image analysis for variable wavelength interferometry", Proc. SPIE 10445, 1044504 (2017). CrossRef D. Litwin, A. M. Sadik, "Computer-aided variable wavelength Fourier transform polarizing microscopy of birefringent fibers.", Optica Applicata 28(2), 139 (1998). DirectLink D. Litwin, J. Galas, N. Błocki, "Automated variable wavelength interferometry in reflected light mode", Proc.SPIE 6188, 61880F (2006). CrossRef M. Pluta, "Variable wavelength interferometry of birefringent retarders", Opt. Laser Technology, 19(3), 131 (1987). CrossRef K. Fladischer et al. "An ellipsoidal mirror for focusing neutral atomic and molecular beams", New journal of Physics, 12(3) 033018 (2010). CrossRef K. Fladischer et al. "An optical profilometer for characterizing complex surfaces under high vacuum conditions", Precision engineering Elsevier 32(3), 182 (2008). CrossRef A.E. Weeks et al. "Accurate surface profilometry of ultrathin wafers", Semiconductor Science and Technology", IOP Publishing, 22(9), 997 (2007). CrossRef D. Litwin et al. "Overview of the measuring systems where a continuously altered light source plays a key role: Part I", Proc. SPIE 10808, 10 8080B (2018). CrossRef D. Litwin et al. "Noise reduction in an optical emission spectrometer with rotating diffraction grating", Proc. SPIE 10142 101421Q (2016). CrossRef D. Litwin et al. "Photonics approach to traffic signs", Proc SPIE 10142 1014214, (2016). CrossRef

scholarly journals Measuring the Phase of an Optical Field from Two Intensity Measurements: Analysis of a Simple Theoretical Model

2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
Damien P. Kelly
Keyword(s):  
Phase Retrieval ◽  
Complex Function ◽  
Image Plane ◽  
Optical Field ◽  
Optical Systems ◽  
Phase Information ◽  
Fourier Plane ◽  
Optical Elements ◽  
Intensity Measurements ◽  
Theoretical Assumptions

Under the scalar paraxial approximation, an optical wavefield is considered to be complex function dependent on position; i.e., at a given location in space the optical field is a complex value with an intensity and phase. The optical wavefield propagates through space and can be modeled using the Fresnel transform. Lenses, apertures, and other optical elements can be used to control and manipulate the wavefield and to perform different types of signal processing operations. Often these optical systems are described theoretically in terms of linear systems theory leading to a commonly used Fourier optics framework. This is the theoretical framework that we will assume in this manuscript. The problem which we consider is how to recover the phase of an optical wavefield over a plane in space. While today it is relatively straightforward to measure the intensity of the optical wavefield over a plane using CMOS or CCD sensors, recovering the phase information is more complicated. Here we specifically examine a variant of the problem of phase retrieval using two intensity measurements. The intensity of the optical wavefield is recorded in both the image plane and the Fourier plane. To make the analysis simpler, we make a series of important theoretical assumptions and describe how in principle the phase information can be recovered. Then, a deterministic but iterative algorithm is derived and we examine the characteristics and properties of this algorithm. Finally, we examine some of the theoretical assumptions we have made and how valid these assumptions are in practice. We then conclude with a brief discussion of the results.

Joint processing of image plane and wavefront sensor information to measure large aberrations in optical systems

1998 ◽  
Author(s):  
Michael C. Roggemann ◽  
Timothy J. Schulz ◽  
Byron M. Welsh ◽  
Chee Wai Ngai ◽  
Jason T. Kraft
Keyword(s):  
Image Plane ◽  
Optical Systems ◽  
Wavefront Sensor ◽  
Joint Processing ◽  
Sensor Information

The Design of Double Liquid Zoom Lens’ Model Based on Electrowetting Effect

2011 ◽  
Vol 84-85 ◽  
pp. 436-441
Author(s):  
Ke Li ◽  
Jin Li Zhang ◽  
Hai Xing Zhao
Keyword(s):  
Image Plane ◽  
Optical Systems ◽  
Zoom Lens ◽  
Inferential Reasoning ◽  
Lens Model ◽  
Focal Distance ◽  
Software Simulation ◽  
External Voltage ◽  
Solid Liquid ◽  
Mechanical Movement

The electrowetting effect is one physical chemistry phenomenon, it through adds certain external voltage in the solid - liquid contact surface to change the liquid to the solid moist degree, thus changing the contact angle of liquids and solids. In this article double liquid zoom lens are based on this kind of electrowetting effect. Optics focal variation system realizes the focal variation to satisfy two basic conditions[2]: (1) changing the focal distance; (2) maintaining the image plane position invariance. The single liquid zoom lens cannot maintain the position of the image formation surface invariance, this article takes on the electrowetting effect double liquid zoom lens as a foundation, and designs to realize new optical systems without mechanical movement focal variation using the motor control, and through MATLAB software simulation inferential reasoning the result.

Measurements in 3D images

1991 ◽  
Vol 49 ◽  
pp. 408-409
Author(s):  
John C. Russ
Keyword(s):  
Three Dimensional ◽  
Image Plane ◽  
X Rays ◽  
Traditional Use ◽  
3D Images ◽  
Confocal Scanning Laser Microscope ◽  
Hard Materials ◽  
Depth Direction ◽  
Confocal Scanning ◽  
Confocal Scanning Laser

Three-dimensional (3D) images consisting of arrays of voxels can now be routinely obtained from several different types of microscopes. These include both the transmission and emission modes of the confocal scanning laser microscope (but not its most common reflection mode), the secondary ion mass spectrometer, and computed tomography using electrons, X-rays or other signals. Compared to the traditional use of serial sectioning (which includes sequential polishing of hard materials), these newer techniques eliminate difficulties of alignment of slices, and maintain uniform resolution in the depth direction. However, the resolution in the z-direction may be different from that within each image plane, which makes the voxels non-cubic and creates some difficulties for subsequent analysis.

Comparison of Conventional and Electron Spectroscopic Imaging in the Fixed Beam Electron Microscope of Ordered Protein Arrays

1985 ◽  
Vol 43 ◽  
pp. 74-75
Author(s):  
E. L. Buhle ◽  
U. Aebi
Keyword(s):  
Image Processing ◽  
Electron Microscope ◽  
High Resolution ◽  
Image Plane ◽  
Electron Spectroscopic Imaging ◽  
Protein Arrays ◽  
Beam Electron ◽  
Average Unit ◽  
Fixed Beam ◽  
Energy Components

CTEM brightfield images are formed by a combination of relatively high resolution elastically scattered electrons and unscattered and inelastically scattered electrons. In the case of electron spectroscopic images (ESI), the inelastically scattered electrons cause a loss of both contrast and spatial resolution in the image. In the case of ESI imaging on the Zeiss EM902, the transmited electrons are dispersed into their various energy components by passing them through a magnetic prism spectrometer; a slit is then placed in the image plane of the prism to select the electrons of a given energy loss for image formation. The purpose of this study was to compare CTEM with ESI images recorded on a Zeiss EM902 of ordered protein arrays. Digital image processing was employed to analyze the average unit cell morphologies of the two types of images.

The restoration of blurred electron micrographs

1986 ◽  
Vol 44 ◽  
pp. 180-181
Author(s):  
Bridget Carragher ◽  
David A. Bluemke ◽  
Michael J. Potel ◽  
Robert Josephs
Keyword(s):  
Cross Section ◽  
Electron Micrographs ◽  
Relative Motion ◽  
Finite Thickness ◽  
Image Plane ◽  
Helical Axis ◽  
Thin Sections ◽  
Structural Details

We have investigated the feasibility of restoring blurred electron micrographs. Two related problems have been considered; the restoration of images blurred as a result of relative motion between the specimen and the image plane, and the restoration of images which are rotationally blurred about an axis. Micrographs taken while the specimen is drifting result in images which are blurred in the direction of motion. An example of rotational blurring arises in micrographs of thin sections of helical particles viewed in cross section. The twist of the particle within the finite thickness of the section causes the image to appear rotationally blurred about the helical axis. As a result, structural details, particularly at large distances from the helical axis, will be obscured.

Sign in / Sign up

Export Citation Format

Share Document