Intensity fluctuations in the image plane of certain optical systems

1971 ◽  
Vol 14 (2) ◽  
pp. 216-220
Author(s):  
F. A. Markus ◽  
E. I. Filatova
Keyword(s):  
Image Plane ◽  
Optical Systems ◽  
Intensity Fluctuations

Image plane tilt in optical systems

1992 ◽  
Vol 31 (3) ◽  
pp. 527 ◽  
Author(s):  
Jose M. Sasian
Keyword(s):  
Image Plane ◽  
Optical Systems

Non-Gaussian intensity fluctuations in the image plane of an optical system

1997 ◽  
Author(s):  
Ivan A. Popov ◽  
Nikolay V. Sidorovsky ◽  
Leonid M. Veselov
Keyword(s):  
Optical System ◽  
Image Plane ◽  
Intensity Fluctuations ◽  
Non Gaussian

scholarly journals Dedicated optical systems of the Institute of Applied Optics

2019 ◽  
Vol 11 (2) ◽  
pp. 29 ◽  
Author(s):  
Dariusz Litwin ◽  
Jacek Galas ◽  
Marek Daszkiewicz ◽  
Tadeusz Kryszczyński ◽  
Adam Czyżewski ◽  
...  
Keyword(s):  
Incidence Angle ◽  
Science And Technology ◽  
High Vacuum ◽  
Polymeric Materials ◽  
Image Plane ◽  
Molecular Beams ◽  
Thickness Measurement ◽  
Optical Systems ◽  
Measurement Science ◽  
Applied Optics

The paper presents a collection of selected optical systems recently developed in the Institute of Applied Optics-INOS. The collection includes the family of techniques where the continuously modified wavelength facilitates high accuracy measurements of optical and geometrical features of the object in question i.e. the variable wavelength interferometry and confocal chromatic sensors. In addition, the paper refers to the construction of a new type of a spectrometer with rotating plasma and an illumination system supporting the road safety. Full Text: PDF ReferencesM. Pluta, Advanced Light Microscopy (Vol. 3, PWN, Elsevier, Warszawa-Amsterdam-London-New York-Tokyo, 1993). DirectLink M. Pluta, "Object-adapted variable-wavelength interferometry. I. Theoretical basis", Journal of Opt. Soc. Am., A4(11), 2107 (1987). CrossRef M. Pluta, "Variable wavelength microinterferometry of textile fibres", J. Microscopy, 149(2), 97 (1988). CrossRef M. Pluta, "On double‐refracting microinterferometers which suffer from a variable interfringe spacing across the image plane", Journal of Microscopy, 145(2), 191 (1987). CrossRef K. A. El-Farahaty, A. M. Sadik, A. M. Hezma, "Study of Optical and Structure Properties of Polyester (PET) and Copolyester (PETG) Fibers by Interferometry", International Journal of Polymeric Materials 56(7),715 (2007). CrossRef J. Galas, D. Litwin, M. Daszkiewicz, "New approach for identifying the zero-order fringe in variable wavelength interferometry", Proc. SPIE 10142, 101421R (2016). CrossRef A. Sadik, W. A. Ramadan, D. Litwin, "Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres", Measurement Science and Technology, IOP Publishing 14(10), 1753 (2003). CrossRef J. Galas, S. Sitarek; D. Litwin; M. Daszkiewicz, "Fringe image analysis for variable wavelength interferometry", Proc. SPIE 10445, 1044504 (2017). CrossRef D. Litwin, A. M. Sadik, "Computer-aided variable wavelength Fourier transform polarizing microscopy of birefringent fibers.", Optica Applicata 28(2), 139 (1998). DirectLink D. Litwin, J. Galas, N. Błocki, "Automated variable wavelength interferometry in reflected light mode", Proc.SPIE 6188, 61880F (2006). CrossRef M. Pluta, "Variable wavelength interferometry of birefringent retarders", Opt. Laser Technology, 19(3), 131 (1987). CrossRef K. Fladischer et al. "An ellipsoidal mirror for focusing neutral atomic and molecular beams", New journal of Physics, 12(3) 033018 (2010). CrossRef K. Fladischer et al. "An optical profilometer for characterizing complex surfaces under high vacuum conditions", Precision engineering Elsevier 32(3), 182 (2008). CrossRef A.E. Weeks et al. "Accurate surface profilometry of ultrathin wafers", Semiconductor Science and Technology", IOP Publishing, 22(9), 997 (2007). CrossRef D. Litwin et al. "Overview of the measuring systems where a continuously altered light source plays a key role: Part I", Proc. SPIE 10808, 10 8080B (2018). CrossRef D. Litwin et al. "Noise reduction in an optical emission spectrometer with rotating diffraction grating", Proc. SPIE 10142 101421Q (2016). CrossRef D. Litwin et al. "Photonics approach to traffic signs", Proc SPIE 10142 1014214, (2016). CrossRef

scholarly journals Measuring the Phase of an Optical Field from Two Intensity Measurements: Analysis of a Simple Theoretical Model

2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
Damien P. Kelly
Keyword(s):  
Phase Retrieval ◽  
Complex Function ◽  
Image Plane ◽  
Optical Field ◽  
Optical Systems ◽  
Phase Information ◽  
Fourier Plane ◽  
Optical Elements ◽  
Intensity Measurements ◽  
Theoretical Assumptions

Under the scalar paraxial approximation, an optical wavefield is considered to be complex function dependent on position; i.e., at a given location in space the optical field is a complex value with an intensity and phase. The optical wavefield propagates through space and can be modeled using the Fresnel transform. Lenses, apertures, and other optical elements can be used to control and manipulate the wavefield and to perform different types of signal processing operations. Often these optical systems are described theoretically in terms of linear systems theory leading to a commonly used Fourier optics framework. This is the theoretical framework that we will assume in this manuscript. The problem which we consider is how to recover the phase of an optical wavefield over a plane in space. While today it is relatively straightforward to measure the intensity of the optical wavefield over a plane using CMOS or CCD sensors, recovering the phase information is more complicated. Here we specifically examine a variant of the problem of phase retrieval using two intensity measurements. The intensity of the optical wavefield is recorded in both the image plane and the Fourier plane. To make the analysis simpler, we make a series of important theoretical assumptions and describe how in principle the phase information can be recovered. Then, a deterministic but iterative algorithm is derived and we examine the characteristics and properties of this algorithm. Finally, we examine some of the theoretical assumptions we have made and how valid these assumptions are in practice. We then conclude with a brief discussion of the results.

Trivariate characteristics of intensity fluctuations for heavily saturated optical systems

2004 ◽  
Vol 43 (4) ◽  
pp. 834 ◽  
Author(s):  
Biman Das ◽  
Eli Drake ◽  
John Jack
Keyword(s):  
Optical Systems ◽  
Intensity Fluctuations
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