scholarly journals Transmittances of thin polymer films and their suitability as a supportive substrate for a soft x-ray solar filter

1991 ◽  
Author(s):  
Memorie K. Williams ◽  
Evan Hansen ◽  
Arturo Reyes-Mena ◽  
David D. Allred
2015 ◽  
Vol 7 (5) ◽  
pp. 3162-3169 ◽  
Author(s):  
Ignacio Martín-Fabiani ◽  
Esther Rebollar ◽  
Mari Cruz García-Gutiérrez ◽  
Daniel R. Rueda ◽  
Marta Castillejo ◽  
...  

2006 ◽  
Vol 39 (3) ◽  
pp. 433-442 ◽  
Author(s):  
P. Busch ◽  
M. Rauscher ◽  
D.-M. Smilgies ◽  
D. Posselt ◽  
C. M. Papadakis

Grazing-incidence small-angle X-ray or neutron scattering of thin polymer films reveals information about the ordering and preferential orientations of the phase-separated microdomains within the films. The grazing-incidence geometry enhances the surface sensitivity; however, the scattering has to be treated within the framework of the distorted-wave Born approximation. In this work, the case of thin films with lamellar mesostructure is studied, where the orientation of the lamellae is either perpendicular or parallel to the film interfaces. For perpendicular lamellae, Bragg rods are found, which are extended along the film normal, whereas for parallel lamellae, peaks along the film normal appear. The positions of the maxima present in the latter case are explained by accounting for refraction at the film surface and reflection at the film–substrate interface. The results are relevant for thin films of lamellar diblock copolymers.


2010 ◽  
Vol 82 (1) ◽  
Author(s):  
M. K. Mukhopadhyay ◽  
L. B. Lurio ◽  
Z. Jiang ◽  
X. Jiao ◽  
Michael Sprung ◽  
...  

1998 ◽  
Vol 4 (S2) ◽  
pp. 828-829
Author(s):  
D. A. Winesett ◽  
H. Ade ◽  
A. P. Smith ◽  
M. Rafailovich ◽  
S. Sokolov ◽  
...  

The study of wetting and dewetting in thin polymer films has many implications for technological applications of polymer films, including dielectric films to control conductivity and colloidal paint systems. We have started to use a novel approach, Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy, to characterize dewetting in thin polymer films. We have investigated a polystyrene/brominated polystyrene (PS/PBrS) bilayer model system with the Scanning Transmission X-ray Microscope (STXM) at the National Synchrotron Light Source. Our method offers quantitative thickness mapping of all constituent components in these thin polymer films.NEXAFS imaging of polymers has advantages over other forms of microscopy primarily because of its low damage, good chemical sensitivity, and the possibility for quantitative analysis. Figure 1 shows four micrographs of one PS/PBrS bilayer annealed for one week at 170 C.


2011 ◽  
Vol 21 (03n04) ◽  
pp. 67-73
Author(s):  
P. BALOURIA ◽  
I. M. GOVIL ◽  
B. P. MOHANTY ◽  
M. L. GARG ◽  
K. ISHII

We have calculated the production cross-sections of continuous X-rays for commonly used thin polymer films on the basis of the theories of quasi-free electron bremsstrahlung (QFEB), secondary electron bremsstrahlung (SEB), atomic bremsstrahlung (AB) and nuclear bremsstrahlung (NB). These results are compared with that of experimental one. We found that SEB is the main contributing factor and the contribution of QFEB, AB and NB is negligible. This work would facilitate choice among available polymer materials and lay down well-defined standard data against which new candidates might be judged.


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