Trace Element Characterization of Thin Polymer Films by Proton-Induced X-Ray Emission Spectrometry

1977 ◽  
Vol 10 (4) ◽  
pp. 868-870 ◽  
Author(s):  
Dennis N. Breiter ◽  
Marvin L. Roush
Keyword(s):  
Trace Element ◽  
Polymer Films ◽  
Emission Spectrometry ◽  
Thin Polymer Films ◽  
X Ray ◽  
Thin Polymer

Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation

1998 ◽  
Vol 5 (5) ◽  
pp. 1304-1308 ◽  
Author(s):  
Keitaro Kago ◽  
Hitoshi Endo ◽  
Hideki Matsuoka ◽  
Hitoshi Yamaoka ◽  
Nozomu Hamaya ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Synchrotron Radiation ◽  
Film Thickness ◽  
Polymer Films ◽  
Curve Fitting ◽  
Thin Polymer Films ◽  
X Ray ◽  
Fitting Procedure ◽  
Thin Polymer

X-ray reflectivity (XR) measurements with a synchrotron radiation source were carried out for thin polymer films on a glass plate. From the XR data, the film thickness and surface and interface roughnesses could be determined. In addition, the appropriate conditions and precision for measurements were also discussed. Kiessig fringes were observed clearly for specular XR measurements of poly(methylmethacrylate) thin film. Analysis of the XR data allowed the determination of the film thickness very precisely. By a curve-fitting procedure of the XR profile, the film-surface roughness and film–substrate interface roughnesses were determined. A Fourier transform of the XR data was performed as an alternative method of evaluating the film thickness. The values for the film thickness obtained by the curve-fitting procedure and Fourier-transform procedure were slightly different from each other. One possibility for the cause of this difference may be an integral error and/or cut-off effect in the Fourier-transform procedure. The XR technique with synchrotron radiation is a very powerful tool for structural characterization of thin polymer films.

scholarly journals Characterization of Thin Polymer Films by Neutron and X-ray Reflectometry

Kobunshi ◽  
1993 ◽  
Vol 42 (12) ◽  
pp. 984-985,967
Author(s):  
Hitoshi Yamaoka ◽  
Hideki Matsuoka
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
X Ray ◽  
Thin Polymer

scholarly journals Transmittances of thin polymer films and their suitability as a supportive substrate for a soft x-ray solar filter

1991 ◽  
Author(s):  
Memorie K. Williams ◽  
Evan Hansen ◽  
Arturo Reyes-Mena ◽  
David D. Allred
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
X Ray ◽  
Thin Polymer

Development and characterization of thin polymer films relevant to fiber processing

2009 ◽  
Vol 517 (15) ◽  
pp. 4348-4354 ◽  
Author(s):  
Junlong Song ◽  
Jing Liang ◽  
Xiaomeng Liu ◽  
Wendy E. Krause ◽  
Juan P. Hinestroza ◽  
...  
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
Thin Polymer ◽  
Fiber Processing

Acoustic resonant spectroscopy for characterization of thin polymer films

2006 ◽  
Vol 77 (10) ◽  
pp. 104901 ◽  
Author(s):  
Hironori Tohmyoh ◽  
Takuya Imaizumi ◽  
Masumi Saka
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
Thin Polymer

Characterization of ultra-thin polymer films by polarization modulation FTIR spectroscopy

2001 ◽  
Vol 164 (1) ◽  
pp. 159-166
Author(s):  
Gerald Steiner ◽  
Olesya Savchuk ◽  
Hella Möller ◽  
Dirk Ferse ◽  
Hans-Jürgen Adler ◽  
...  
Keyword(s):  
Ftir Spectroscopy ◽  
Polymer Films ◽  
Polarization Modulation ◽  
Thin Polymer Films ◽  
Thin Polymer

scholarly journals Mapping the Structural Order of Laser-Induced Periodic Surface Structures in Thin Polymer Films by Microfocus Beam Grazing Incidence Small-Angle X-ray Scattering

2015 ◽  
Vol 7 (5) ◽  
pp. 3162-3169 ◽  
Author(s):  
Ignacio Martín-Fabiani ◽  
Esther Rebollar ◽  
Mari Cruz García-Gutiérrez ◽  
Daniel R. Rueda ◽  
Marta Castillejo ◽  
...  
Keyword(s):  
Polymer Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Surface Structures ◽  
Thin Polymer Films ◽  
Periodic Surface ◽  
X Ray ◽  
Structural Order ◽  
X Ray Scattering ◽  
Thin Polymer
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