scholarly journals Normal incidence multilayer telescope for soft X-ray beam expander

2003 ◽  
Author(s):  
Hideyo Kunieda ◽  
Kazutami Misaki ◽  
Yoshito Haba ◽  
Manabu Ishida ◽  
Kei Itoh ◽  
...  
Keyword(s):  
X Ray ◽  
1988 ◽  
Vol 49 (C1) ◽  
pp. C1-115-C1-118 ◽  
Author(s):  
M. E. BRUNER ◽  
B. M. HAISCH ◽  
W. A. BROWN ◽  
L. W. ACTON ◽  
J. H. UNDERWOOD
Keyword(s):  

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.


2000 ◽  
Vol 453 (1-3) ◽  
pp. 183-190 ◽  
Author(s):  
G.J. Jackson ◽  
S.M. Driver ◽  
D.P. Woodruff ◽  
B.C.C. Cowie ◽  
R.G. Jones

1989 ◽  
Vol 1 (2) ◽  
pp. 190-206
Author(s):  
David L. Shealy ◽  
David R. Gabardi ◽  
Richard B. Hoover ◽  
Arthur B. C. Walker Jr. ◽  
Joakim F. Lindblom ◽  
...  
Keyword(s):  

Nanoscale ◽  
2018 ◽  
Vol 10 (5) ◽  
pp. 2226-2230 ◽  
Author(s):  
Matthias Meier ◽  
Zdeněk Jakub ◽  
Jan Balajka ◽  
Jan Hulva ◽  
Roland Bliem ◽  
...  

Benchmarking DFT calculations against precise normal incidence X-ray standing wave measurements.


Author(s):  
Claudio Ferrari ◽  
Riccardo Lolli ◽  
Bianca Salmaso ◽  
Giovanni Pareschi ◽  
Gianpiero Tagliaferri ◽  
...  
Keyword(s):  
X Ray ◽  

2018 ◽  
Vol 54 (14) ◽  
pp. 1417-1420
Author(s):  
S. A. Darznek ◽  
V. B. Mityukhlyaev ◽  
P. A. Todua ◽  
M. N. Filippov

Author(s):  
Daniel Zimmer ◽  
Vincent Bagnoud ◽  
Boris Ecker ◽  
Udo Eisenbarth ◽  
Jamil Habib ◽  
...  
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document