SOFT X-RAY IMAGES OF THE SOLAR CORONA USING NORMAL INCIDENCE OPTICS

1988 ◽  
Vol 49 (C1) ◽  
pp. C1-115-C1-118 ◽  
Author(s):  
M. E. BRUNER ◽  
B. M. HAISCH ◽  
W. A. BROWN ◽  
L. W. ACTON ◽  
J. H. UNDERWOOD
Keyword(s):  
Solar Corona ◽  
Normal Incidence ◽  
X Ray

scholarly journals Soft X-ray Images of the Solar Corona with a Normal-Incidence Cassegrain Multilayer Telescope

Science ◽  
1988 ◽  
Vol 241 (4874) ◽  
pp. 1781-1787 ◽  
Author(s):  
A. B. C. WALKER ◽  
J. F. LINDBLOM ◽  
T. W. BARBEE ◽  
R. B. HOOVER
Keyword(s):  
Solar Corona ◽  
Normal Incidence ◽  
X Ray

Some Problems in Understanding the Solar Corona

1994 ◽  
Vol 144 ◽  
pp. 1-9
Author(s):  
A. H. Gabriel
Keyword(s):  
Solar Corona ◽  
Solar Atmosphere ◽  
Theoretical Modelling ◽  
Total System ◽  
Major Advance ◽  
X Ray ◽  
Proper Perspective ◽  
Space Observations

The development of the physics of the solar atmosphere during the last 50 years has been greatly influenced by the increasing capability of observations made from space. Access to images and spectra of the hotter plasma in the UV, XUV and X-ray regions provided a major advance over the few coronal forbidden lines seen in the visible and enabled the cooler chromospheric and photospheric plasma to be seen in its proper perspective, as part of a total system. In this way space observations have stimulated new and important advances, not only in space but also in ground-based observations and theoretical modelling, so that today we find a well-balanced harmony between the three techniques.

scholarly journals Silicon in the solar corona

1965 ◽  
Vol 23 ◽  
pp. 115-123
Author(s):  
K. G. Widing ◽  
J. R. Porter
Keyword(s):  
Solar Corona ◽  
Relative Intensity ◽  
Line Emission ◽  
X Ray ◽  
Resonance Transitions ◽  
Spectral Ranges

Resonance lines of coronal ions of silicon are prominent in the spectral ranges 40–62 Å and 254–356 Å.An unexpected feature of the soft X-ray spectrum is the weakness or absence of the resonance lines of iron in ionization stages XI through XV.A second feature is the prominence of lines of the type (3d → 2p) relative to the resonance transitions (3p → 2s) in Li-like and Beryllium-like spectra. It is suggested that the upper levels (3d) are excited by quadrupole collisions from the ground 2s or 2s2levels.The intensity of the soft X-ray lines relative to the resonance lines in the 300 Å region seems to be more consistent with temperatures well above one million degrees than with temperatures as low as 700000°K, but the data are not adequate for a precise comparison. The relative intensity of the line emission from the various stages of silicon ionization may be interpreted as indicating that the ionization of silicon peaks in stages IX and X.The abundances of C, Mg, S, and Al relative to silicon do not seem to be greatly different from the chromospheric abundances reported by Pottasch or with the photospheric abundances.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

The structure of the surface phase: a new normal-incidence X-ray standing wave study

2000 ◽  
Vol 453 (1-3) ◽  
pp. 183-190 ◽  
Author(s):  
G.J. Jackson ◽  
S.M. Driver ◽  
D.P. Woodruff ◽  
B.C.C. Cowie ◽  
R.G. Jones
Keyword(s):  
Standing Wave ◽  
Normal Incidence ◽  
Surface Phase ◽  
New Normal ◽  
X Ray

Design of a Normal Incidence Multilayer Imaging X-Ray Microscope

1989 ◽  
Vol 1 (2) ◽  
pp. 190-206
Author(s):  
David L. Shealy ◽  
David R. Gabardi ◽  
Richard B. Hoover ◽  
Arthur B. C. Walker Jr. ◽  
Joakim F. Lindblom ◽  
...  
Keyword(s):  
Normal Incidence ◽  
X Ray

scholarly journals Probing the geometry of copper and silver adatoms on magnetite: quantitative experiment versus theory

Nanoscale ◽  
2018 ◽  
Vol 10 (5) ◽  
pp. 2226-2230 ◽  
Author(s):  
Matthias Meier ◽  
Zdeněk Jakub ◽  
Jan Balajka ◽  
Jan Hulva ◽  
Roland Bliem ◽  
...  
Keyword(s):  
Dft Calculations ◽  
Standing Wave ◽  
Normal Incidence ◽  
X Ray ◽  
Wave Measurements ◽  
Experiment Versus ◽  
Silver Adatoms

Benchmarking DFT calculations against precise normal incidence X-ray standing wave measurements.

scholarly journals MHD Aspects of Coronal Transients

1980 ◽  
Vol 91 ◽  
pp. 263-277 ◽  
Author(s):  
U. Anzer
Keyword(s):  
Solar Corona ◽  
Time Scales ◽  
White Light ◽  
Solar Flares ◽  
Great Length ◽  
X Ray

If one defines coronal transients as events which occur in the solar corona on rapid time scales (≲ several hours) then one would have to include a large variety of solar phenomena: flares, sprays, erupting prominences, X-ray transients, white light transients, etc. Here we shall focus our attention on the latter two phenomena; solar flares have been discussed at great length in a recent Skylab workshop and IAU Colloqium No. 44 was devoted to the study of prominences. Coronal transients, in the narrower sense, were first seen with the instruments on board of Skylab, both in the optical and the X-ray part of the spectrum.

Electron Probe X-Ray Analysis of Nanofilms at Off-Normal Incidence of the Electron Beam

2018 ◽  
Vol 54 (14) ◽  
pp. 1417-1420
Author(s):  
S. A. Darznek ◽  
V. B. Mityukhlyaev ◽  
P. A. Todua ◽  
M. N. Filippov
Keyword(s):  
Electron Beam ◽  
Electron Probe ◽  
Normal Incidence ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document