Statistical analysis in MRSM approach of computing and experimental results for integrated circuit technology

2002 ◽  
Author(s):  
Alexander A. Kouleshoff ◽  
Wieslaw B. Kuzmicz ◽  
Viktor S. Malyshev ◽  
Vladislav V. Nelayev ◽  
Viktor R. Stempitsky
Keyword(s):  
Statistical Analysis ◽  
Integrated Circuit ◽  
Experimental Results ◽  
Circuit Technology

Preparation of TEM samples by focused ion beams

1995 ◽  
Vol 53 ◽  
pp. 518-519
Author(s):  
John F. Walker ◽  
J C Reiner ◽  
C Solenthaler
Keyword(s):  
Integrated Circuit ◽  
Polycrystalline Silicon ◽  
Field Effect Transistor ◽  
High Spatial Resolution ◽  
Ion Beam ◽  
Ion Beams ◽  
Focused Ion Beams ◽  
Precise Location ◽  
Effect Transistor ◽  
Circuit Technology

The high spatial resolution available from TEM can be used with great advantage in the field of microelectronics to identify problems associated with the continually shrinking geometries of integrated circuit technology. In many cases the location of the problem can be the most problematic element of sample preparation. Focused ion beams (FIB) have previously been used to prepare TEM specimens, but not including using the ion beam imaging capabilities to locate a buried feature of interest. Here we describe how a defect has been located using the ability of a FIB to both mill a section and to search for a defect whose precise location is unknown. The defect is known from electrical leakage measurements to be a break in the gate oxide of a field effect transistor. The gate is a square of polycrystalline silicon, approximately 1μm×1μm, on a silicon dioxide barrier which is about 17nm thick. The break in the oxide can occur anywhere within that square and is expected to be less than 100nm in diameter.

scholarly journals Wireless distance measurement by means of ultra-wideband chaotic radio pulses

2019 ◽  
Vol 30 ◽  
pp. 12005
Author(s):  
Elena Efremova ◽  
Alexander Dmitriev ◽  
Lev Kuzmin ◽  
Manvel Petrosyan
Keyword(s):  
Statistical Analysis ◽  
Distance Measurement ◽  
Experimental Results ◽  
Ultra Wideband

A method for wireless distance measurement using ultrawideband chaotic radio pulses based on statistical analysis is proposed. Experimental results are discussed.

PERFORMANCE AT THE EDGE: GALLIUM ARSENIDE AND SILICON ICs FOR OPTICAL ELECTRONICS

1991 ◽  
Vol 02 (03) ◽  
pp. 147-162 ◽  
Author(s):  
ROBERT G. SWARTZ
Keyword(s):  
Gallium Arsenide ◽  
Optical Communication ◽  
Optical Communications ◽  
Integrated Circuit ◽  
High Performance ◽  
Compound Semiconductor ◽  
Performance Curve ◽  
Semiconductor Technology ◽  
Market Trends ◽  
Circuit Technology

Compound semiconductor technology is rapidly entering the mainstream, and is quickly finding its way into consumer applications where high performance is paramount. But silicon integrated circuit technology is evolving up the performance curve, and CMOS in particular is consuming ever more market share. Nowhere is this contest more clearly evident than in optical communications. Here applications demand performance ranging from a few hundreds of megahertz to multi-gigahertz, from circuits containing anywhere from tens to tens of thousands of devices. This paper reviews the high performance electronics found in optical communication applications from a technology standpoint, illustrating merits and market trends for these competing, yet often complementary IC technologies.

scholarly journals Design and Development of a 3dB Quadrature Patch Hybrid Coupler

2018 ◽  
Vol 7 (2.6) ◽  
pp. 217
Author(s):  
B Sekharbabu ◽  
K Narsimha Reddy ◽  
S Sreenu
Keyword(s):  
Integrated Circuit ◽  
High Frequency ◽  
Return Loss ◽  
Coupling Factor ◽  
Power Combiners ◽  
Measurement Results ◽  
Structure Simulation ◽  
Hybrid Coupler ◽  
Port Device ◽  
Circuit Technology

In this paper a -3 dB, 90-degreephase shift RF quadrature patch hybrid coupler is designed to operate at 2.4GHz. Hybrid coupler is a four-port device, that’s accustomed split a signaling with a resultant 90degrees’ section shift between output signals whereas maintaining high isolation between the output ports. The RF quadrature patch hybrid coupler is used in various radio frequency applications including mixers, power combiners, dividers, modulators and amplifiers. The desired hybrid coupler is designed using FR-4 substrate with 1.6mm height in High Frequency Structure Simulation (HFSS) and the same is fabricated and tested. The designed Hybrid coupler is examined in terms of parameters like insertion Loss, coupling factor and return Loss. The simulation and measurement results are compared. Major advantages of the RF quadrature patch hybrid couplers are that they are compatible with integrated circuit technology.

Conversion Method of Description Files in Structural Testing of Digital Circuit

2013 ◽  
Vol 427-429 ◽  
pp. 1285-1288
Author(s):  
Kang Yi Wang
Keyword(s):  
Integrated Circuit ◽  
Large Scale ◽  
Digital Circuit ◽  
Logic Circuit ◽  
Structural Testing ◽  
Digital Logic ◽  
Continuous Development ◽  
Program Correctness ◽  
Testing Program ◽  
Circuit Technology

With the continuous development of large-scale integrated circuit technology, the importance of structural testing and testability design for digital logic circuit has become increasingly evident. In the testing domain, Bench is the most commonly used formats to describe a measured circuit. In order to test the measured circuit using computer, files with various formats must be converted to a netlist file which can be identified by computer. Lev format is a common netlist file. This paper mainly discusses how to convert the Bench file into Lev file, and it is proved by testing program correctness and robustness.

Statistical Gate-Delay Modeling with Copulas

2020 ◽  
Vol 15 (3) ◽  
pp. 1-10
Author(s):  
Walter Schneider
Keyword(s):  
Circuit Design ◽  
Integrated Circuit ◽  
Process Variations ◽  
Deep Submicron ◽  
Experimental Results ◽  
Gate Delay ◽  
Integrated Circuit Design ◽  
Circuit Performance ◽  
Delay Models ◽  
Innovative Concept

The growing impact of process variations on circuit performance has become a major concern for deep-submicron integrated circuit design, resulting in numerous SSTA-algorithms. The acceptance of such algorithms in industry however will be dependent on modeling the real silicon behavior in SSTA. This includes that the statistical gate-delay models must consider arbitrary process variations and dependencies. In this paper, we introduce the innovative concept of Copulas to handle this topic. A complete Matlab based framework starting from process parameter statistics up to the computation of the statistical gate-delay distribution is presented. Experimental results demonstrate the importance of accounting realistic process variations.

On the Application of Statistical Analysis for Interpretation of Experimental Results in Environmental Microbiology

Microbiology ◽  
2019 ◽  
Vol 88 (2) ◽  
pp. 232-239
Author(s):  
A. Yu. Kallistova ◽  
A. F. Sabrekov ◽  
V. M. Goncharov ◽  
N. V. Pimenov ◽  
M. V. Glagolev
Keyword(s):  
Statistical Analysis ◽  
Environmental Microbiology ◽  
Experimental Results
Sign in / Sign up

Export Citation Format

Share Document