Single-beam recording and retrieving of sub-wavelength-size optical information in a photorefractive crystal using near-field scanning optical microscopy

2002 ◽  
Author(s):  
Kyoung-Youm Kim ◽  
Jingu Kang ◽  
Byoungho Lee
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Photorefractive Crystal ◽  
Optical Information ◽  
Single Beam ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Sub Wavelength

Photoreflectance Near-Field Scanning Optical Microscopy

1999 ◽  
Vol 588 ◽  
Author(s):  
Charles Paulson ◽  
Brian Hawkins ◽  
Jingxi Sun ◽  
Arthur B. Ellis ◽  
Leon Mccaughan ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Electric Fields ◽  
Spatial Resolution ◽  
High Intensity ◽  
Near Field ◽  
And Topology ◽  
Wavelength Resolution ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Sub Wavelength

AbstractA novel Near-field Scanning Optical Microscopy (NSOM) technique is used to obtain simultaneous topology, photoluminescence and photoreflectance (PR) spectra. PR spectra from GaAs surfaces were obtained and the local electric fields were calculated. Sub-wavelength resolution is expected for this technique and achieved for PL and topology measurements. Photovoltages, resulting from the high intensity of light at the NSOM tip, can limit the spatial resolution of the electric field determination.

scholarly journals Spatial Resolution of Near-Field Scanning Optical Microscopy with Sub-Wavelength Aperture

2000 ◽  
Vol 138 ◽  
pp. 173-174 ◽  
Author(s):  
Hiroaki Nakamura ◽  
Keiji Sawada ◽  
Hirotomo Kambe ◽  
Toshiharu Saiki ◽  
Tetsuya Sato
Keyword(s):  
Optical Microscopy ◽  
Spatial Resolution ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Sub Wavelength

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy for characterisation of photovoltaic materials

2004 ◽  
Vol 1 (9) ◽  
pp. 2292-2297 ◽  
Author(s):  
E. E. van Dyk ◽  
A. Karoui ◽  
A. H. La Rosa ◽  
G. Rozgonyi
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Photovoltaic Materials ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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